Scanning tunnelling microscopy and spectroscopy of ultra-flat graphene on hexagonal boron nitride

Nature Materials

Volumn 10, Issue 4, 2011, Pages 282-285

  Xue, Jiamin ^a   Sanchez Yamagishi, Javier ^b   Bulmash, Danny ^b   Jacquod, Philippe ^a,c   Deshpande, Aparna ^a,e   Watanabe, K ^d   Taniguchi, T ^d   Jarillo Herrero, Pablo ^b   Leroy, Brian J ^a  

^a University of Arizona   (United States)

^b MASSACHUSETTS INSTITUTE OF TECHNOLOGY   (United States)

^c UNIVERSITY OF ARIZONA   (United States)

^d NATIONAL INSTITUTE FOR MATERIALS SCIENCE   (Japan)

^e Northwestern University   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

BORON NITRIDE; GRAPHENE DEVICES; NITRIDES; SCANNING TUNNELING MICROSCOPY;

DEVICE PERFORMANCE; DISPERSION RELATIONS; ELECTRONICS TECHNOLOGY; FUNDAMENTAL PHYSICS; HEXAGONAL BORON NITRIDE; HEXAGONAL BORON NITRIDE (H-BN); SCANNING TUNNELLING MICROSCOPY AND SPECTROSCOPY; SPECTROSCOPIC MEASUREMENTS;

GRAPHENE;

EID: 79953031816     PISSN: 14761122     EISSN: 14764660     Source Type: Journal    
DOI: 10.1038/nmat2968     Document Type: Article

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