Physics-of-failure-based prognostics for electronic products

Transactions of the Institute of Measurement and Control

Volumn 31, Issue 3-4, 2009, Pages 309-322

  Pecht, Michael ^a   Jie Gu, ^b  

^a UNIVERSITY OF MARYLAND   (United States)

^b UNIVERSITY OF MARYLAND   (United States)

Author keywords

Electronics; Physics of failure; Prognostics; Reliability prediction.

Indexed keywords

DAMAGE DETECTION; ELECTRONIC EQUIPMENT; FORECASTING; LIFE CYCLE; PRODUCT DESIGN; RELIABILITY; UNCERTAINTY ANALYSIS;

DAMAGE ACCUMULATION; NORMAL OPERATING CONDITIONS; PHYSICS OF FAILURES; PRODUCT RELIABILITY; PROGNOSTICS; PROGNOSTICS AND HEALTH MANAGEMENTS; RELIABILITY DESIGN; RELIABILITY PREDICTION;

FAILURE (MECHANICAL);

EID: 67650709427     PISSN: 01423312     EISSN: None     Source Type: Journal    
DOI: 10.1177/0142331208092031     Document Type: Article

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