Failure analysis of high power white LEDs

"2008 26th International Conference on Microelectronics, Proceedings, MIEL 2008"

Volumn , Issue , 2008, Pages 255-257

  Cassanelli, G ^a   Mura, G ^b   Fantini, F ^a   Vanzi, M ^c  

^a UNIVERSITY OF MODENA AND REGGIO EMILIA   (Italy)

^b SARDEGNA RICERCHE   (Italy)

^c UNIVERSITY OF CAGLIARI   (Italy)

Author keywords

[No Author keywords available]

Indexed keywords

ABS RESINS; DEGRADATION; MICROELECTRONICS; SAFETY FACTOR; SILVER; SULFUR;

DEGRADATION MECHANISMS; INTERNATIONAL CONFERENCES; WHITE LEDS;

FAILURE ANALYSIS;

EID: 50249124957     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/ICMEL.2008.4559272     Document Type: Conference Paper

References (6)

1. G. Meneghesso et al. "Failure Modes and Mechanisms of DC-Aged GaN LEDs" Phisica St. Solidi (a) Vol. 194, Issue 2, pp 389-392.
2. M.Meneghini et al. "High brightness GaN LEDs degradation during de and pulsed stress", Microel. Reliab, Vol 46, Issues 9-11 pp. 1720-1724
3. K.H. Lee, S.W.R. Lee. "Process development for yellow phosphor coating on blue light emitting diodes (LEDs) for white light illumination". 8th Electronics Packaging Technology Conference EPTC '06. 6-8 Dec. 2006. pp. 379-38
4. T.E. Graedel. "Corrosion mechanism for silver exposed to the atmosphere," J. Electrochem. Society, vol. 139, no.7, pp. 1963-1970, July 1992.
5. Metal Handbook, Ninth Edition, vol. 13. Corrosion, pp. 793, 1107, ASM International.
6. B. H. Chudnovsky "Degradation of Power Contacts in Industrial Atmosphere: Silver Corrosion and Whiskers" Electrical Contacts, 2002. Proceedings of the Forty-Eighth IEEE Holm Conference on Oct. 2002 pp. 140 - 150.