'Sub-atomic' resolution of non-contact atomic force microscope images induced by aheterogeneous tip structure: A density functional theory study

Nanotechnology

Volumn 22, Issue 29, 2011, Pages

  Campbellová, Anna ^a   Ondráček, Martin ^b   Pou, Pablo ^c   Pérez, Rubén ^c   Klapetek, Petr ^a   Jelínek, Pavel ^b  

^a CZECH METROLOGY INSTITUTE   (Czech Republic)

^b INSTITUTE OF PHYSICS   (Czech Republic)

^c UNIVERSIDAD AUTÓNOMA DE MADRID   (Spain)

Author keywords

[No Author keywords available]

Indexed keywords

A-DENSITY; AFM IMAGE; AFM TIP; ATOMIC FORCE MICROSCOPE IMAGES; ATOMIC FORCE MICROSCOPES; ATOMIC RESOLUTION; ATTRACTIVE FORCE REGIME; FIRST-PRINCIPLES DENSITY FUNCTIONAL THEORY; IMAGE PATTERNS; NON-CONTACT; RECONSTRUCTED SURFACES; SI (1 1 1); TIP STRUCTURE; DENSITY FUNCTIONAL THEORY STUDIES; FIRST PRINCIPLES DENSITY FUNCTIONAL THEORY (DFT) CALCULATIONS;

ADATOMS; ATOMIC FORCE MICROSCOPY; DENSITY FUNCTIONAL THEORY; MICROSCOPES; CALCULATIONS; CRYSTAL ATOMIC STRUCTURE; DESIGN FOR TESTABILITY;

CRYSTAL ATOMIC STRUCTURE; DENSITY FUNCTIONAL THEORY;

EID: 79960548126     PISSN: 09574484     EISSN: 13616528     Source Type: Journal    
DOI: 10.1088/0957-4484/22/29/295710     Document Type: Article

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