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Volumn 420, Issue 1-3, 2006, Pages 177-182
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Electron scattering in scanning probe microscopy experiments
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Author keywords
[No Author keywords available]
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Indexed keywords
ATOMIC FORCE MICROSCOPY;
CANTILEVER BEAMS;
ELECTRON TRANSITIONS;
ELECTRON TUNNELING;
SCANNING;
SILICON;
OSCILLATING CANTILEVER;
SILICON TIP;
SUBATOMIC VARIATIONS;
TUNNELLING BARRIER;
ELECTRON SCATTERING;
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EID: 33344469666
PISSN: 00092614
EISSN: None
Source Type: Journal
DOI: 10.1016/j.cplett.2005.12.065 Document Type: Article |
Times cited : (20)
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References (24)
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