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Volumn 420, Issue 1-3, 2006, Pages 177-182

Electron scattering in scanning probe microscopy experiments

Author keywords

[No Author keywords available]

Indexed keywords

ATOMIC FORCE MICROSCOPY; CANTILEVER BEAMS; ELECTRON TRANSITIONS; ELECTRON TUNNELING; SCANNING; SILICON;

EID: 33344469666     PISSN: 00092614     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.cplett.2005.12.065     Document Type: Article
Times cited : (20)

References (24)


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.