The role of tip size and orientation, tip-surface relaxations and surface impurities in simultaneous AFM and STM studies on the TiO2(110) surface

Nanotechnology

Volumn 20, Issue 26, 2009, Pages

  Pinto, Henry P ^a   Enevoldsen, Georg H ^b   Besenbacher, Flemming ^b   Lauritsen, Jeppe V ^b   Foster, Adam S ^a,c  

^a AALTO UNIVERSITY   (Finland)

^b AARHUS UNIVERSITY   (Denmark)

^c TAMPERE UNIVERSITY OF TECHNOLOGY   (Finland)

Author keywords

[No Author keywords available]

Indexed keywords

AFM; CONTRAST PATTERNS; KEY FACTORS; MEASURED CURRENTS; MULTI-CHANNEL; NONCONTACT ATOMIC FORCE MICROSCOPY; PHYSICAL DATA; SCANNING MODE; SCANNING TUNNELING MICROSCOPY (STM); STM STUDY; SURFACE IMPURITIES; TIO;

ATOMIC FORCE MICROSCOPY; SCANNING; SURFACE RELAXATION;

SCANNING TUNNELING MICROSCOPY;

TITANIUM DIOXIDE;

ARTICLE; ATOMIC FORCE MICROSCOPY; CONTROLLED STUDY; CORRELATION ANALYSIS; EXPERIMENTAL MODEL; IMAGE ANALYSIS; ORIENTATION; PARTICLE SIZE; PRIORITY JOURNAL; SCANNING TUNNELING MICROSCOPY; SIMULATION; STRUCTURE ANALYSIS; SURFACE PROPERTY;

EID: 67649383344     PISSN: 09574484     EISSN: 13616528     Source Type: Journal    
DOI: 10.1088/0957-4484/20/26/264020     Document Type: Article

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