Short-range electrostatic interactions in atomic-resolution scanning force microscopy on the Si(111) 7×7 surface

Physical Review B - Condensed Matter and Materials Physics

Volumn 68, Issue 3, 2003, Pages 353241-353247

  Lantz, M A ^a,b   Hug, H J ^a   Hoffmann, R ^a   Martin, S ^a   Baratoff, A ^a   Guntherodt H J ^a  

^a UNIVERSITY OF BASEL   (Switzerland)

^b IBM RESEARCH ZURICH   (Switzerland)

Author keywords

[No Author keywords available]

Indexed keywords

SILICON;

ARTICLE; ATOMIC FORCE MICROSCOPY; ATOMIC RESOLUTION SCANNING FORCE MICROSCOPY; ENERGY; GEOMETRY; LOW TEMPERATURE PROCEDURES; MATHEMATICAL ANALYSIS; MICROSCOPY; MOLECULAR INTERACTION; SCANNING FORCE MICROSCOPY;

EID: 0344307480     PISSN: 10980121     EISSN: None     Source Type: Journal    
DOI: None     Document Type: Article

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