Nano-structures developing at the graphene/silicon carbide interface

Surface Science

Volumn 605, Issue 5-6, 2011, Pages

  Vizzini, S ^a,b   Enriquez, H ^a,b   Chiang, S ^a,b,c   Oughaddou, H ^d   Soukiassian, P ^a,b  

^a DIF   (France)

^b UNIVERSITÉ PARIS SACLAY   (France)

^c UNIVERSITY OF CALIFORNIA   (United States)

^d UNIVERSITÉ DE CERGY PONTOISE   (France)

Author keywords

[No Author keywords available]

Indexed keywords

CRACK DEFECTS; ELECTRONIC INTERFACE; EPITAXIAL GRAPHENE; GRAPHENE LAYERS; NANO-OBJECTS; SCANNING TUNNELING MICROSCOPY AND SPECTROSCOPY; SMALL AREA;

CARBON NANOTUBES; CRACKS; GRAPHENE; SCANNING TUNNELING MICROSCOPY; SEMICONDUCTING SILICON COMPOUNDS; SILICON CARBIDE; SURFACE DEFECTS;

CARRIER MOBILITY;

EID: 79751531736     PISSN: 00396028     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.susc.2011.01.006     Document Type: Article

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