Photoelectron diffraction study of the Si-rich 3C-SiC(001)-(3 × 2) structure

Physical Review B - Condensed Matter and Materials Physics

Volumn 70, Issue 4, 2004, Pages

  Tejeda, A ^a,b   Dunham, D ^c,f   Garcia De Abajo F J ^d   Denlinger, J D ^e   Rotenberg, E ^a,b   Michel, E G ^b,c   Soukiassian, P ^b,c  

^a INSTITUTO NICOLÁS CABRERA   (Spain)

^b DIF   (France)

^c NORTHERN ILLINOIS UNIVERSITY   (United States)

^d DONOSTIA INTERNATIONAL PHYSICS CENTER DIPC   (Spain)

^e LAWRENCE BERKELEY NATIONAL LABORATORY   (United States)

^f UNIVERSITY OF WISCONSIN EAU CLAIRE   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

DIMER; SILICON;

ARTICLE; ATOM; CALCULATION; DIMERIZATION; ELECTRON; ENERGY; FACTORIAL ANALYSIS; PHOTON; X RAY DIFFRACTION;

EID: 42749106528     PISSN: 01631829     EISSN: None     Source Type: Journal    
DOI: 10.1103/PhysRevB.70.045317     Document Type: Article

References (70)

1. Silicon Carbide, A Review of Fundamental Questions and Applications to Current Device Technology, edited by W. J. Choyke, H. M. Matsunami, and G. Pensl (Akademie Verlag, Berlin, 1998), Vols. I & II, and references therein.
2. Silicon Carbide Electronic Devices and Materials, MRS Bull. 22 (1997), and references therein.
3. IEEE Transactions on Electron Devices, special issue on Silicon Carbide Electronic Devices, 46 (3) (1999), and references therein.
4. V. M. Bermudez, Phys. Status Solidi B 202, 447 (1997), and references therein.
5. P. Soukiassian, Mater. Sci. Eng., B 61, 506 (1999), and references therein.
6. M. Dayan, J. Vac. Sci. Technol. A 3, 361 (1985).
7. M. Dayan, J. Vac. Sci. Technol. A 4, 38 (1986).
8. R. Kaplan, Surf. Sci. 215, 111 (1989).
9. S. Hara, W. F. J. Slijkerman, J. F. van der Veen, I. Ohdomari, S. Misawa, E. Sakuma, and S. Yoshida, Surf. Sci. Lett. 231, L196 (1990).
10. T. Yoshinobu, I. Izumikawa, H. Mitsui, and T. Fuyuki, Appl. Phys. Lett. 59,2844 (1991).
11. S. Hara, S. Misawa, S. Yoshida, and Y. Aoyagi, Phys. Rev. B 50, 4548 (1994).
12. V. M. Bermudez and J. P. Long, Appl. Phys. Lett. 66, 475 (1995).
13. S. Hara, J. Kitamura, H. Okushi, S. Misawa, S. Yoshida, and Y. Tokumaru, Surf. Sci. 357-358, 436 (1996).
14. F. Semond, L. Douillard, P. Soukiassian, D. Dunham, F. Amy, and S. Rivillon, Appl. Phys. Lett. 68, 2144 (1996).
15. F. Semond, P. Soukiassian, P. Mangat, Z. Hurych, L. di Cioccio, and C. Jaussaud, Appl. Surf. Sci. 104-105, 79 (1996).
16. H. W. Yeom, Y.-C. Chao, S. Terada, S. Hara, S. Yoshida, and R. I. G. Uhrberg, Phys. Rev. B 56, R15525 (1997).
17. H. W. Yeom, Y.-C. Chao, I. Matsuda, S. Hara, S. Yoshida, and R. I. G. Uhrberg, Phys. Rev. B 58, 10540 (1998).
18. M. Lübbe, K. Lindner, S. Sloboshanin, S. Tautz, J. Schäfer, and D. R. T. Zahn, J. Vac. Sci. Technol. A 16, 3471 (1995).
19. A. Mayne, F. Semond, G. Dujardin, and P. Soukiassian, Phys. Rev. B 57, R15108 (1998).
20. U. Rossow, K. Lindner, M. Lübbe, D. E. Aspnes, and D. R. T. Zahn, J. Vac. Sci. Technol. B 16, 2355 (1998).
21. H. Nienhaus, V. van Elsbergen, and W. Mönch, Eur. Phys. J. B 9, 179 (1999).
22. J. Kitamura, S. Hara, H. Okushi, S. Yoshida, S. Misawa, and W. Kajimura, Surf. Sci. 433, 465 (1999).
23. S. Hara, J. Kitamura, H. Okushi, S. Misawa, S. Yoshida, K. Kajimura, H. W. Yeom, and R. I. G. Uhrberg, Surf. Sci. 421, L143 (1999).
24. H. W. Yeom, Y.-C. Chao, S. Terada, S. Hara, S. Yoshida, and R. I. G. Uhrberg, Surf. Sci. 433-435, 392 (1999).
25. H. W. Yeom, I. Matsuda, Y.-C. Chao, S. Hara, S. Yoshida, and R. I. G. Uhrberg, Phys. Rev. B 61, R2417 (2000).
26. V. Derycke, P. Soukiassian, F. Amy, Y. Chabal, M. D'angelo, H. Enriquez, and M. Silly, Nat. Mater. 2, 263 (2003).
27. M. Kitabatake and J. E. Greene, Jpn. J. Appl. Phys., Part 1 35, 5261 (1996).
28. M. Kitabatake and J. E. Greene, Appl. Phys. Lett. 69, 2048 (1996).
29. W. Lu, W. G. Schmidt, E. L. Briggs, and J. Bernholc, Phys. Rev. Lett. 85, 4381 (2000).
30. H. Yan, A. P. Smith, and H. Jónsson, Surf. Sci. 330, 265 (1995).
31. W. Lu, P. Krüger, and J. Pollmann, Phys. Rev. B 60, 2495 (1999).
32. S. A. Shevlin and A. J. Fisher, Appl. Surf. Sci. 162-163, 94 (2000).
33. L. Pizzagalli, A. Catellani, G. Galli, F. Gygi, and A. Baratoff, Phys. Rev. B 60, R5129 (1999).
34. V. M. Bermudez, in Ref. 1, p. 447.
35. F. Semond, P. Soukiassian, A. Mayne, G. Dujardin, L. Douillard, and C. Jaussaud, Phys. Rev. Lett. 77, 2013 (1996).
36. P. Soukiassian, F. Semond, A. Mayne, and G. Dujardin, Phys. Rev. Lett. 79, 2498 (1997).
37. L. Douillard, V. Yu. Aristov, F. Semond, and P. Soukiassian, Surf. Sci. 401, L395 (1998).
38. V. Yu. Aristov, L. Douillard, and P. Soukiassian, Surf. Sci. 440, L825 (1999).
39. M. D'angelo, H. Enriquez, V. Yu. Aristov, P. Soukiassian, G. Renaud, A. Barbier, M. Noblet, S. Chiang, and F. Semond, Phys. Rev. B 68, 165321 (2003).
40. W. F. Egelhoff, Crit. Rev. Solid State Mater. Sci. 16, 213 (1990).
41. C. S. Fadley, M. A. Van Hove, Z. Hussain, A. P. Kaduwela, R. E. Couch, Y. J. Kim, P. M. Len, J. Palomares, S. Ryce, S. Ruebush, E. D. Tober, Z. Wang, R. X. Ynzunza, H. Daimon, H. Galloway, M. B. Salmeron, and W. Schattke, Surf. Rev. Lett. 4, 421 (1997).
42. A. Mascaraque, J. Avila, C. Teodorescu, M. C. Asensio, and E. G. Michel, Phys. Rev. B 55, R7315 (1997).
43. E. L. Bullock, G. S. Herman, M. Yamada, D. J. Friedman, and C. S. Fadley, Phys. Rev. B 41, 1703 (1990).
44. R. Terborg, P. Baumgärtel, R. Lindsay, O. Schaff, T. Gießel, J. T. Hoeft, M. Polcik, R. L. Toomes, S. Kulkarni, A. M. Bradshaw, and D. P. Woodruff, Phys. Rev. B 61, 16697 (2000).
45. E. L. Bullock, R. Gunnella, L. Patthey, T. Abukawa, S. Kono, C. R. Natoli, and L. S. O. Johansson, Phys. Rev. Lett. 74, 2756 (1995).
46. M. Shimomura, T. Abukawa, K. Yoshimura, J. H. Oh, H. W. Yeom, and S. Kono, Surf. Sci. 493, 23 (2001).
47. S. A. Chambers, S. B. Anderson, and J. H. Weaver, Phys. Rev. B 32, 581 (1985).
48. S. W. King, C. Ronning, R. F. Davis, R. S. Busby, and R. J. Nemanich, J. Appl. Phys. 84, 6042 (1998).
49. L. Simon, J. L. Bischoff, and L. Kubler, Phys. Rev. B 60, 11653 (1999).
50. O. M. Küttel, R. G. Agostino, R. Fasel, J. Osterwalder, and L. Schlapbach, Surf. Sci. 312, 131 (1994).
51. C. Pirri, M. H. Tuilier, P. Wetzel, S. Hong, D. Bolmont, G. Gewinner, R. Cortès, O. Heckmann, and H. von Känel, Phys. Rev. B 51, 2302 (1995).
52. S. Kono, J. Electron Spectrosc. Relat. Phenom. 126, 43 (2002), and references therein.
53. M. Shimomura, H. W. Yeom, B. S. Mun, C. S. Fadley, S. Hara, S. Yoshida, and S. Kono, Surf. Sci. 438, 237 (1999).
54. Y. Chen, F. J. Garcia de Abajo, A. Chassé, R. X. Ynzunza, A. P. Kaduwela, M. A. Van Hove, and C. S. Fadley, Phys. Rev. B 58, 13121 (1998); Y. Chen and M. A. Van Hove, http://electron.lbl.gov/mscdpack/.
55. Y. Chen, F. J. Garcia de Abajo, A. Chassé, R. X. Ynzunza, A. P. Kaduwela, M. A. Van Hove, and C. S. Fadley, Phys. Rev. B 58, 13121 (1998); Y. Chen and M. A. Van Hove, http://electron.lbl.gov/mscdpack/.
56. F. J. Garcia de Abajo, M. A. Van Hove, and C. S. Fadley, Phys. Rev. B 63, 075404 (2001). See also EDAC code at http:// electron.lbl.gov/edac and http://dipc.ehu.es/edac.
57. The mean free path was calculated according to Ref. 57. During the refinement of low kinetic energy data, the mean free path was fitted as a parameter (optimum value: 3 Å).
58. S. Tanuma, C. J. Powell, and D. R. Penn, Surf. Interface Anal. 17, 927 (1991).
59. The domains considered are due to the fact that a 180° rotation of the whole cluster shown in Fig. 10 is an equally acceptable structure. This domain structure does not affect the LEED pattern.
60. R. S. Saiki, A. P. Kaduwela, M. Sagurton, J. Osterwalder, D. J. Friedman, C. S. Fadley, and C. R. Brundle, Surf. Sci. 282, 33 (1993).
61. M. A. Van Hove, S. Y. Tong, and M. H. Elconin, Surf. Sci. 64, 85 (1977).
62. High kinetic energy peaks are mostly sensitive to interatomic directions in the bulk. However, they are also affected by other factors as the surface structure itself. A more accurate fit would require one to optimize the structure of the surface layer, as is done in the refinement process.
63. R. Fasel, P. Aebi, J. Osterwalder, L. Schlapbach, R. G. Agostino, and G. Chiarello. Phys. Rev. B 50, 14516 (1994).
64. The R-factor in this paper is calculated without smoothing. It is known that smoothing leads to a markedly lower R-factor value (Ref. 64).
65. M. Van Hove, W. Moritz, H. Over, P. J. Rous, A. Wander, A. Barbieri, N. Materer, U. Starke, and G. A. Somorjai, Surf. Sci. Rep. 19, 191 (1993).
66. 0=2.25 Å. The inner potential was optimized for each energy, with values in the range 5-15 eV. See also Ref. 56.
67. M. Takahashi, S. Nakatani, Y. Ito, T. Takahashi, X. W. Zhang, and M. Ando, Surf. Sci. 357-358, 78 (1996).
68. J. J. Boland, Phys. Rev. Lett. 65, 3325 (1990); 67, 1539 (1991); Surf. Sci. 261, 17 (1992).
69. J. J. Boland, Phys. Rev. Lett. 65, 3325 (1990); 67, 1539 (1991); Surf. Sci. 261, 17 (1992).
70. J. J. Boland, Phys. Rev. Lett. 65, 3325 (1990); 67, 1539 (1991); Surf. Sci. 261, 17 (1992).