Functional surface reconstructions of hexagonal SiC

Journal of Physics Condensed Matter

Volumn 16, Issue 17, 2004, Pages

  Heinz, K ^a   Bernhardt, J ^a   Schardt, J ^a   Starke, U ^a,b  

^a UNIVERSITY OF ERLANGEN NUREMBERG   (Germany)

^b MAX PLANCK INSTITUT FÜR FESTKÖRPERFORSCHUNG   (Germany)

Author keywords

[No Author keywords available]

Indexed keywords

CRYSTAL DEFECTS; HETEROJUNCTIONS; INTERFACES (MATERIALS); LOW ENERGY ELECTRON DIFFRACTION; PASSIVATION; SCANNING TUNNELING MICROSCOPY; SINGLE CRYSTALS; SURFACE PROPERTIES;

BASAL SURFACES; DEFECT-FREE INTERFACES; OXYGEN UPTAKE; POLYTYPES;

SILICON CARBIDE;

EID: 2442719380     PISSN: 09538984     EISSN: None     Source Type: Journal    
DOI: 10.1088/0953-8984/16/17/013     Document Type: Review

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