Scanning-tunneling-microscopy of the formation of carbon nanocaps on SiC(0 0 0 -1)

Chemical Physics Letters

Volumn 423, Issue 4-6, 2006, Pages 317-320

  Maruyama, Takahiro ^a   Bang, Hyungjin ^a   Kawamura, Yasuyuki ^a   Fujita, Naomi ^a   Tanioku, Kenji ^a   Shiraiwa, Tomoyuki ^a   Hozumi, Yoko ^a   Naritsuka, Shigeya ^a   Kusunoki, Michiko ^b  

^a MEIJO UNIVERSITY   (Japan)

^b JAPAN FINE CERAMICS CENTER   (Japan)

Author keywords

[No Author keywords available]

Indexed keywords

CARBON; HEAT TREATMENT; OPTICAL RESOLVING POWER; SCANNING TUNNELING MICROSCOPY; SILICON CARBIDE; SUBSTRATES;

ATOMIC-RESOLUTION ULTRAHIGH-VACUUM SCANNING TUNNELING MICROSCOPY (UHV-STM); CARBON NANOCAPS; SURFACE OXIDES;

NANOSTRUCTURED MATERIALS;

EID: 33646740973     PISSN: 00092614     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.cplett.2006.03.029     Document Type: Article

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