Scanning tunneling microscopy investigation of the C-terminated β-SiC(100) c(2 × 2) surface reconstruction: dimer orientation, defects and antiphase boundaries

Surface Science

Volumn 446, Issue 1-2, 2000, Pages

  Derycke, V ^a,b   Soukiassian, P ^a,b   Mayne, A ^b   Dujardin, G ^b  

^a CEA SACLAY   (France)

^b UNIVERSITÉ PARIS SACLAY   (France)

Author keywords

[No Author keywords available]

Indexed keywords

CHEMICAL BONDS; COMPRESSIVE STRESS; CRYSTAL DEFECTS; DIMERS; LOW ENERGY ELECTRON DIFFRACTION; MOLECULAR ORIENTATION; SCANNING TUNNELING MICROSCOPY; SPECTROSCOPY; SURFACE STRUCTURE; SURFACE TREATMENT; SYNCHROTRON RADIATION;

ANTIPHASE BOUNDARIES; CHARGE REDISTRIBUTION; DIMER ORIENTATIONS; TRIPLE BOND DIMERS;

SILICON CARBIDE;

EID: 0034140698     PISSN: 00396028     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0039-6028(99)01067-5     Document Type: Article

References (19)

1. Choyke W.J., Matsunami H.M., Pensl G. Silicon Carbide: A Review of Fundamental Questions and Applications to Current Device Technology. vols. I and II:1998;Akademie, Berlin. and references therein.
2. Harris G. Properties of Silicon Carbide. EMIS Datareview Series. vol. 13:1995;INSPEC, London.
3. Silicon carbide electronic devices and materials. Mater. Res. Soc. Bull. 22:(March):1997.
4. Bermudez V.M. Phys. Stat. Solidi b. 202:1997;447. and references therein.
5. Soukiassian P., Semond F. Surface and interfaces of advances materials. J. Physique IV. 7:(C6):1997;101.
6. Soukiassian P. Mater. Sci. Eng. B. 61:1999;506.
7. Powers J.M., Wander A., Rous P.J., Van Hove M.A., Somorjai G.A. Phys. Rev. B. 44:1991;11159.
8. Long J.P., Bermudez V.M., Ramaker D.E. Phys. Rev. Lett. 76:1996;991.
9. Derycke V., Soukiassian P., Mayne A., Dujardin G., Gautier J. Phys. Rev. Lett. 81:1998;5868.
10. Tautz F.S., Sloboshanin S., Hohenecker S., Zahn D.R.T., Schaefer J.A. Appl. Surf. Sci. 123/124:1998;17.
11. Badziag P. Phys. Rev. B. 44:1991;11143.
12. Yan H., Smith A.P., Jónsson H. Surf. Sci. 330:1995;265.
13. Sabisch M., Krüger P., Mazur A., Rohlfing M., Pollmann J. Phys. Rev. B. 53:1996;13121.
14. Käckell P., Furthmüller J., Bechtedt F., Kresse G., Hafner J. Phys. Rev. B. 54:1996;10304.
15. Catellani A., Galli G., Gygi F. Phys. Rev. Lett. 77:1996;5090.
16. Soukiassian P., Semond F., Douillard L., Mayne A., Dujardin G., Pizzagalli L., Joachim C. Phys. Rev. Lett. 78:1997;907.
17. Duke C.B. Chem. Rev. 96:1996;1237. and references therein.
18. Kubby J.A., Boland J.J. Surf. Sci. Rep. 26:1996;63.
19. Semond F., Soukiassian P., Mayne A., Dujardin G., Douillard L., Jaussaud C. Phys. Rev. Lett. 77:1996;2013.