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Volumn 79, Issue 13, 1997, Pages 2498-2501

Highly stable Si atomic line formation on the β-SiC(100) surface

Author keywords

[No Author keywords available]

Indexed keywords


EID: 0000471991     PISSN: 00319007     EISSN: 10797114     Source Type: Journal    
DOI: 10.1103/PhysRevLett.79.2498     Document Type: Article
Times cited : (108)

References (21)
  • 10
  • 13
    • 0000920530 scopus 로고
    • G. Harris, EMIS Datareview SeriesINSPEC, London
    • R. Kaplan and V. M. Bermudez, in Properties of Silicon Carbide, G. Harris, EMIS Datareview Series (INSPEC, London, 1995), Vol. 13, p. 101.
    • (1995) Properties of Silicon Carbide , vol.13 , pp. 101
    • Kaplan, R.1    Bermudez, V.M.2


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.