Atom scale characterization of the near apex region of an atomic force microscope tip

Microscopy and Microanalysis

Volumn 16, Issue 5, 2010, Pages 636-642

  Tourek, Christopher J ^a   Sundararajan, Sriram ^a  

^a Iowa State University of Science and Technology   (United States)

Author keywords

3D atom probe tomography (APM); atom probe microscope; atomic force microscope (AFM); thin film

Indexed keywords

EID: 79551475047     PISSN: 14319276     EISSN: 14358115     Source Type: Journal    
DOI: 10.1017/S1431927610000437     Document Type: Article

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