Stress of needle specimen on the three-dimensional atom probe (3DAP)

Surface and Interface Analysis

Volumn 40, Issue 13, 2008, Pages 1610-1613

  Mayama, N ^a   Yamashita, C ^a   Kaito, T ^b   Nojima, M ^c   Owari, M ^a,d  

^a INSTITUTE OF INDUSTRIAL SCIENCE   (Japan)

^b SII NANOTECHNOLOGY INC   (Japan)

^c TOKYO UNIVERSITY OF SCIENCE   (Japan)

^d UNIVERSITY OF TOKYO   (Japan)

Author keywords

3DAP; Electric stress; Local electrode; Simulation

Indexed keywords

ATOMS; BUBBLES (IN FLUIDS); NEEDLES; PROBES; THREE DIMENSIONAL;

3DAP; ATOM PROBES; ELECTRIC STRESS; LOCAL ELECTRODE; ONE WAY; SIMULATION; TAPER ANGLES; TECHNICAL ISSUES;

ATOMIC PHYSICS;

EID: 58449127007     PISSN: 01422421     EISSN: 10969918     Source Type: Journal    
DOI: 10.1002/sia.2905     Document Type: Article

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