Observations of Si field evaporation

Ultramicroscopy

Volumn 107, Issue 2-3, 2007, Pages 124-130

  Thompson, Keith ^a   Sebastian, Jason ^a   Gerstl, Stephan ^a  

^a Imago Scientific Instruments   (United States)

Author keywords

Atom probe field emission silicon

Indexed keywords

COMPUTATIONAL GEOMETRY; ELECTRIC CONDUCTIVITY; ELECTRODES; EVAPORATION;

ATOM PROBE FIELD EMISSION SILICON; ELECTRODE GEOMETRY; MASS RESOLUTION; PULSE FRACTION (PF);

CRYSTAL STRUCTURE;

SILICON;

ARTICLE; CRYSTAL; DEGRADATION; ELECTRIC CONDUCTIVITY; ELECTRODE; EVAPORATION; MASS SPECTROMETRY; TEMPERATURE DEPENDENCE;

EID: 33845653182     PISSN: 03043991     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.ultramic.2006.06.007     Document Type: Article

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