SCOPUS 정보 검색 플랫폼

Surface and Interface Analysis

Volumn 31, Issue 7, 2001, Pages 593-598

Interface analysis with the three-dimensional atom probe

(1) Smialek, James L a

a NASA GLENN RESEARCH CENTER (United States)

Author keywords

Atom probe; Grain boundary; Microstructural characterization; Segregation

Indexed keywords

ATOMS; CHARACTERIZATION; FILMS; GRAIN BOUNDARIES; MICROSTRUCTURE; SEPARATION; SUPERALLOYS; SURFACES; THREE DIMENSIONAL; TOMOGRAPHY; WELDS;

ATOM PROBE TOMOGRAPHY; INTERFACE ANALYSIS; MICROSTRUCTURAL CHARACTERIZATION; NEUTRON IRRADIATED PRESSURE VESSEL STEEL WELDS; THREE DIMENSIONAL ATOM PROBE;

PHASE INTERFACES;

EID: 0035394017 PISSN: 01422421 EISSN: None Source Type: Journal
DOI: 10.1002/sia.1086 Document Type: Article

Times cited : (10)

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* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.