Performance of a local electrode atom probe

Surface and Interface Analysis

Volumn 39, Issue 2-3, 2007, Pages 262-267

  Miller, M K ^a   Russell, K F ^a  

^a OAK RIDGE NATIONAL LABORATORY   (United States)

Author keywords

Local electrode atom probe; Preferential evaporation

Indexed keywords

DATA ACQUISITION; ELECTRIC DELAY LINES; ELECTRIC POTENTIAL; ELECTRODES; EVAPORATION;

CROSSED DELAY LINE DETECTORS; LOCAL ELECTRODE ATOM PROBE; PREFERENTIAL EVAPORATION; STANDING VOLTAGE;

PROBES;

EID: 33847011698     PISSN: 01422421     EISSN: 10969918     Source Type: Journal    
DOI: 10.1002/sia.2488     Document Type: Conference Paper

References (4)

1. Kelly TF, Camus PP, Larson DJ, Holzman LM, Bajikar S. Ultramicroscopy 1996; 62: 29.
2. Kelly TF, Larson DJ. Mater. Charact. 2000; 44: 59.
3. Miller MK, Smith GDW. J. Vac. Sci. Technol. 1981; 19: 57.
4. Miller MK, Cerezo A, Hetherington MG, Smith GDW. Atom Probe Field Ion Microscopy. Oxford University Press: Oxford, 1996; 83.