Quantitative comparison of energy-filtering transmission electron microscopy and atom probe tomography

Ultramicroscopy

Volumn 109, Issue 5, 2009, Pages 612-618

  Stender, Patrick ^a   Heil, Tobias ^a   Kohl, Helmut ^a   Schmitz, Guido ^a  

^a UNIVERSITY OF MÜNSTER   (Germany)

Author keywords

Atom probe tomography; EFTEM; Multilayers; Spatial resolution

Indexed keywords

ANALYTICAL TEM; ATOM PROBE TOMOGRAPHY; CHEMICAL SENSITIVITIES; EFTEM; ENERGY-FILTERING TRANSMISSION ELECTRON MICROSCOPIES; FE/CR MULTILAYERS; INSTRUMENTAL PARAMETERS; INTERFACE ROUGHNESS; LAYER STRUCTURES; NANO-METER SCALE; SINGLE LAYERS; SPATIAL RESOLUTION; TEM; THIN-FILM STRUCTURES;

ATOMS; DIAGNOSTIC RADIOGRAPHY; ELECTRON MICROSCOPES; FILM PREPARATION; IMAGE RESOLUTION; MODEL STRUCTURES; MULTILAYERS; PROBES; TOMOGRAPHY;

TRANSMISSION ELECTRON MICROSCOPY;

CHROMIUM; IRON;

ARTICLE; ATOM PROBE TOMOGRAPHY; ENERGY FILTERED TRANSMISSION ELECTRON MICROSCOPY; IMAGE QUALITY; IMAGE RECONSTRUCTION; INTERMETHOD COMPARISON; PARAMETER; QUANTITATIVE ANALYSIS; TOMOGRAPHY;

EID: 62549158192     PISSN: 03043991     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.ultramic.2008.12.009     Document Type: Article

References (15)

1. Reimer L. Energy-Filtering Transmission Electron Microscopy (1995), Springer, Berlin
2. Egerton R.F. Ultramicroscopy 107 (2007) 575
3. Grogger W., Schaffer B., Krishnan K.M., and Hofer F. Ultramicroscopy 96 (2003) 481
4. Schleiwies J., Schmitz G., Heitmann S., and Hütten A. Appl. Phys. Lett. 78 (2001) 3439
5. Larson, Petford-Long A., Ma Y., and Cerezo A. Acta Mater. 52 (2004) 2847
6. Ene C.B., Schmitz G., Kirchheim R., and Hütten A. Acta Mater. 53 (2005) 3383
7. Fert A., Grünberg P., Barthelemy A., Petroff F., and Zinn W. J. Magn. Magn. Mater. 140-W (1995) 1
8. Petford-Long A.K., Cerezo A., and Hyde J.M. Ultramicroscopy 47 (1992) 367
9. Melmed A.J. Appl. Surf. Sci. 94/95 (1996) 17
10. Miller M.K. Atom Probe Tomography (2000), Kluwer Academic/Plenum Publishers, New York
11. Al-Kassab T., Wollenberger H., Schmitz G., and Kirchheim R. In: Ernst T., and Rühle M. (Eds). High Resolution Imaging and Spectrometry of Materials (2003), Springer, Berlin 290
12. Stender P., Oberdorfer C., Artmeier M., Pelka P., Spaleck F., and Schmitz G. Ultramicroscopy 107 (2007) 726
13. Rose A. Adv. Electron. 1 (1948) 131
14. Kohl H., and Rose H. Adv. Electron Electron Phys. 65 (1985) 173
15. Knippelmeyer R., and Kohl H. J. Microsc. 194 (1999) 30