SCOPUS 정보 검색 플랫폼

Progress in Materials Science

Volumn 47, Issue 6, 2002, Pages 621-729

Nanoscale microstructural analysis of metallic materials by atom probe field ion microscopy

(1) Hono, Kazuhiro a

a NATIONAL INSTITUTE FOR MATERIALS SCIENCE (Japan)

Author keywords

[No Author keywords available]

Indexed keywords

MICROSCOPIC EXAMINATION; MICROSTRUCTURE; NANOSTRUCTURED MATERIALS; PRECIPITATION (CHEMICAL);

METALLIC MATERIALS;

ALLOYS;

EID: 0035982005 PISSN: 00796425 EISSN: None Source Type: Journal
DOI: 10.1016/S0079-6425(01)00007-X Document Type: Review

Times cited : (158)

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