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Volumn , Issue , 2010, Pages 531-536

Formal modeling and reasoning for reliability analysis

Author keywords

Reliability; SER; Symbolic techniques

Indexed keywords

CIRCUIT OPTIMIZATION; DESIGN PROCESS; ERROR RATE; FORMAL MODELING; FUTURE TECHNOLOGIES; SER; SYMBOLIC TECHNIQUES; TRANSIENT FAULTS;

EID: 77956197822     PISSN: 0738100X     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1145/1837274.1837406     Document Type: Conference Paper
Times cited : (8)

References (32)
  • 3
    • 21244491597 scopus 로고    scopus 로고
    • Soft errors in advanced computer systems
    • R. C. Baumann, "Soft Errors in Advanced Computer Systems," in IEEE Design and Test of Computers, Vol.22, Issue 3, 2005.
    • (2005) IEEE Design and Test of Computers , vol.22 , Issue.3
    • Baumann, R.C.1
  • 4
    • 33846111258 scopus 로고    scopus 로고
    • Tackling variability and reliability challenges
    • June
    • S. Borkar, "Tackling variability and Reliability Challenges," in IEEE Design and Test of Computers, Vol.23, No.6, pp. 520, June 2006.
    • (2006) IEEE Design and Test of Computers , vol.23 , Issue.6 , pp. 520
    • Borkar, S.1
  • 31
    • 4444372346 scopus 로고    scopus 로고
    • A scalable soft spot analysis methodology for compound noise effects in nano-meter circuits
    • June
    • C. Zhao, X. Bai, and S. Dey, "A Scalable Soft Spot Analysis Methodology for Compound Noise Effects in Nano-meter Circuits," in Proc. of Design Automation Conference (DAC), pp. 894-899, June 2004
    • (2004) Proc. of Design Automation Conference (DAC) , pp. 894-899
    • Zhao, C.1    Bai, X.2    Dey, S.3
  • 32
    • 0029732375 scopus 로고    scopus 로고
    • IBM experiments in soft fails in computer electronics (1978-1994)
    • J. F. Ziegler et al, "IBM experiments in Soft Fails in Computer Electronics (1978-1994)," in IBM Journal of Research and Development, Vol.40, No.1, pp. 3-18, 1996.
    • (1996) IBM Journal of Research and Development , vol.40 , Issue.1 , pp. 3-18
    • Ziegler, J.F.1


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.