On soft error rate analysis of scaled CMOS designs - A statistical perspective

IEEE/ACM International Conference on Computer-Aided Design, Digest of Technical Papers, ICCAD

Volumn , Issue , 2009, Pages 157-163

  Peng, Huan Kai ^a   Wen, Charles H P ^a   Bhadra, Jayanta ^b  

^a NATIONAL CHIAO TUNG UNIVERSITY   (Taiwan)

^b FREESCALE SEMICONDUCTOR INC   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

COSMIC RADIATION; PROCESS VARIATION; PROPAGATION MODELS; SCALED CMOS; SOFT ERROR EFFECTS; SOFT ERROR RATE; STATIC APPROACH; STATISTICAL ANALYSIS; STATISTICAL LEARNING; SUB-90NM TECHNOLOGIES; TRANSIENT FAULTS;

COMPUTER AIDED DESIGN; COSMOLOGY; FAULT TREE ANALYSIS; QUALITY ASSURANCE; RELIABILITY;

LEARNING ALGORITHMS;

EID: 76349116264     PISSN: 10923152     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper

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