Variation impact on ser of combinational circuits

Proceedings - Eighth International Symposium on Quality Electronic Design, ISQED 2007

Volumn , Issue , 2007, Pages 911-916

  Ramakrishnan, K ^a   Rajaraman, R ^a   Suresh, S ^a   Vijaykrishnan, N ^a   Xie, Y ^a   Irwin, M J ^a  

^a PENNSYLVANIA STATE UNIVERSITY   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

ELECTRIC POWER TRANSMISSION; ERROR ANALYSIS; PARAMETER ESTIMATION;

SOFT ERROR RATES (SER); THRESHOLD VARIATIONS;

LOGIC CIRCUITS;

EID: 34548120787     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/ISQED.2007.168     Document Type: Conference Paper

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