Process variability-aware transient fault modeling and analysis

IEEE/ACM International Conference on Computer-Aided Design, Digest of Technical Papers, ICCAD

Volumn , Issue , 2008, Pages 685-690

  Miskov Zivanov, Natasa ^a   Wu, Kai Chiang ^a   Marculescu, Diana ^a  

^a CARNEGIE MELLON UNIVERSITY   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

DESIGN PROCESSES; DIGITAL SYSTEMS; ENVIRONMENTAL VARIATIONS; FEATURE SIZES; IN PROCESSES; INTEGRATION CAPACITIES; MODELING AND ANALYSIS; NEW DESIGNS; PROCESS MANUFACTURING; PROCESS VARIABILITIES; SUPPLY VOLTAGES; TECHNOLOGY SCALES; TRANSIENT FAULTS; YIELD POINTS;

COMPUTER AIDED DESIGN; DESIGN; DIGITAL CIRCUITS; DIGITAL INTEGRATED CIRCUITS; FAILURE ANALYSIS; FAULT TREE ANALYSIS; QUALITY ASSURANCE; RELIABILITY ANALYSIS;

RELIABILITY;

EID: 57849143764     PISSN: 10923152     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/ICCAD.2008.4681651     Document Type: Conference Paper

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