Tackling variability and reliability challenges

IEEE Design and Test of Computers

Volumn 23, Issue 6, 2006, Pages 520-

  Borkar, Shekhar ^a  

^a INTEL CORPORATION   (United States)

Author keywords

Reliability; Technology scaling; Transistor subthreshold leakage; Variability; VLSI designs

Indexed keywords

COMPUTER SOFTWARE; RELIABILITY; VLSI CIRCUITS;

TECHNOLOGY SCALING; TRANSISTOR SUBTHRESHOLD LEAKAGE;

COMPUTER AIDED DESIGN;

EID: 33846111258     PISSN: 07407475     EISSN: None     Source Type: Journal    
DOI: 10.1109/MDT.2006.156     Document Type: Article

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