Modeling and optimization for soft-error reliability of sequential circuits

IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems

Volumn 27, Issue 5, 2008, Pages 803-816

  Miskov Zivanov, Natasa ^a,b   Marculescu, Diana ^a,b  

^a IEEE

^b CARNEGIE MELLON UNIVERSITY   (United States)

Author keywords

Combinational logic circuits; Reliability; Sequential logic circuits; Symbolic manipulation

Indexed keywords

ERROR ANALYSIS; MARKOV PROCESSES; MATHEMATICAL MODELS; RELIABILITY ANALYSIS; SENSITIVITY ANALYSIS; SET THEORY;

COMBINATIONAL LOGIC CIRCUITS; SEQUENTIAL LOGIC CIRCUITS; SYMBOLIC MANIPULATION;

LOGIC CIRCUITS;

EID: 42649138575     PISSN: 02780070     EISSN: None     Source Type: Journal    
DOI: 10.1109/TCAD.2008.917591     Document Type: Article

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