A scalable soft spot analysis methodology for compound noise effects in nano-meter circuits

Proceedings - Design Automation Conference

Volumn , Issue , 2004, Pages 894-899

  Zhao, Chong ^a   Bai, Xiaoliang ^a   Dey, Sujit ^a  

^a UNIVERSITY OF CALIFORNIA   (United States)

Author keywords

Compound noise effect; Nano meter technology; Robustness; Softness distribution

Indexed keywords

ACOUSTIC VARIABLES CONTROL; COMPUTER AIDED DESIGN; COST EFFECTIVENESS; INTEGRATED CIRCUITS; LOGIC DESIGN; NANOSTRUCTURED MATERIALS; OPTIMIZATION; SIGNAL INTERFERENCE;

COMPOUND NOISE EFFECTS; NANO-METER TECHNOLOGY; ROBUSTNESS; SOFTNESS DISTRIBUTION;

NETWORKS (CIRCUITS);

EID: 4444372346     PISSN: 0738100X     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1145/996566.996804     Document Type: Conference Paper

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