Design as you see FIT: System-level soft error analysis of sequential circuits

Proceedings -Design, Automation and Test in Europe, DATE

Volumn , Issue , 2009, Pages 785-790

  Holcomb, Daniel ^a   Wenchao, Li ^a   Seshia, Sanjit A ^a  

^a UNIVERSITY OF CALIFORNIA   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

ERROR CORRECTION; HARDENING; PARETO PRINCIPLE; RADIATION HARDENING; SEQUENTIAL CIRCUITS; TIMING CIRCUITS;

CIRCUIT COMPONENTS; FUNCTIONAL SPECIFICATION; LOW OVERHEAD; PARETO-OPTIMAL; SEQUENTIAL ELEMENTS; SOFT ERROR; SYSTEM LEVELS; TECHNOLOGY SCALING;

ELECTRIC NETWORK ANALYSIS;

EID: 70350062081     PISSN: 15301591     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/date.2009.5090770     Document Type: Conference Paper

References (23)

1. H. Asadi and M. B. Tahoori. Soft error derating computation in sequential circuits. In ICCAD, pages 497-501, 2006.
2. N. Miskov-Zivanov and D. Marculescu. Modeling and Optimization for Soft-Error Reliability of Sequential Circuits. IEEE Trans. on CAD of Integ. Circ. and Sys., pages 803-816, May 2008.
3. N. Miskov-Zivanov and D. Marculescu. Circuit Reliability Analysis Using Symbolic Techniques. IEEE Trans. on CAD of Integ. Circ. and Sys., pages 2638-2649, Dec. 2006.
4. D. Holcomb et al. Berkeley FIT estimation tool (BFIT). http://www.eecs. berkeley.edu/∼holcomb/BFIT.htm [5] R. Baumann. Radiation-induced soft errors in advanced semiconductor technologies. IEEE Trans. Device and Materials Reliability, 5(3):305-316, Sept. 2005.
5. L. B. Freeman. Critical charge calculations for a bipolar SRAM array. IBM J. Res. Dev., 40(1):119-129, 1996.
6. R. Garg et al. A fast, analytical estimator for the SEU-induced pulse width in combinational designs. DAC'08, pages 918-923.
7. P. Hazucha and C. Svensson. Impact of CMOS technology scaling on the atmospheric neutron soft error rate. IEEE Trans. Nuclear Science, 47(6):2586-2594, Dec 2000.
8. J. A. Rivers et al. Phaser: Phased methodology for modeling the system-level effects of soft errors. IBM Journal of Research and Development, 52(3):293-306, May 2008.
9. S. Krishnaswamy, et al. On the role of timing masking in reliable logic circuit design. DAC 2008, pages 924-929.
10. P. Liden, et al. On latching probability of particle induced transients in combinational networks. FTCS 1994, pages 340-349.
11. L. Massengill, et al. Analysis of single-event effects in combinational logicsimulation of the AM2901 bitslice processor. IEEE Trans. Nuclear Science, 47(6):2609-2615, Dec 2000.
12. D. Mavis and P. Eaton. Soft error rate mitigation techniques for modern microcircuits. Rel. Phy. Symp., pages 216-225, 2002.
13. M. Omana, et al. A model for transient fault propagation in combinatorial logic. IOLTS 2003, pages 111-115, July 2003.
14. L.-S. Peh. Flow Control and Micro-Architectural Mechanisms for Extending the Performance of Interconnection Networks. PhD thesis, Stanford University, August 2001.
15. R. R. Rao, et al. Computing the soft error rate of a combinational logic circuit using parameterized descriptors. IEEE Trans. on CAD of Integ. Circ. and Sys., 26(3):468-479, 2007.
16. S. S. Mukherjee et al. A systematic methodology to compute the architectural vulnerability factors for a high-performance microprocessor. In MICRO 2003, pages 29-40.
17. S. A. Seshia, et al. Verification-guided soft error resilience. In DATE 2007, pages 1442-1447.
18. P. Shivakumar, et al. Modeling the effect of technology trends on soft error rate of combinational logic, DSN'02, pp. 389-398.
19. B. Zhang, et al. FASER: fast analysis of soft error susceptibility for cell-based designs. ISQED 2006, pages 755-760.
20. M. Zhang, et al. Sequential element design with built-in soft error resilience. IEEE Transactions on VLSI, Dec. 2006.
21. M. Zhang and N. R. Shanbhag. Soft-error-rate-analysis (SERA) methodology. IEEE Trans. on CAD of Integrated Circuits and Systems, 25(10):2140-2155, 2006.
22. Q. Zhou and K. Mohanram. Gate sizing to radiation harden combinational logic. IEEE Trans. on CAD of Integrated Circuits and Systems, 25(1):155-166, 2006.
23. J. Ziegler. Terrestrial cosmic rays. IBM J. Res. Develop, 40(1):pp19-39, January 1996.