IBM experiments in soft fails in computer electronics (1978-1994)

IBM Journal of Research and Development

Volumn 40, Issue 1, 1996, Pages 3-16

  Ziegler, J F ^a,b,c   Curtis, H W ^{a,d,e,f,g,h,i,j}   Muhlfeld, H P ^k,l,m,n,o   Montrose, C J ^h   Chin, B ^h   Nicewicz, M ^h   Russell, C A ^h   Wang, W Y ^h   Freeman, L B ^h   Hosier, P ^h   LaFave, L E ^h   Walsh, J L ^h   Orro, J M ^h   Unger, G J ^h   Ross, J M ^h   O'Gorman, T J ^h   Messina, B ^h   Sullivan, T D ^h   Sykes, A J ^h   Yourke, H ^h   Enger, T A ^h   Tolat, V ^h   Scott, T S ^h   Taber, A H ^h   Sussman, R J ^h   Klein, W A ^h   Wahaus, C W ^h   more..

^a IBM T J WATSON RESEARCH CENTER   (United States)

^b Mat Anal and Radiat Effects Group

^c IEEE

^d Division of School Psychology and Counselor Education

^e UNIVERSITY OF NEW HAMPSHIRE   (United States)

^f UNIVERSITY OF IOWA   (United States)

^g DARTMOUTH COLLEGE   (United States)

^h IBM Thomas J Watson Res Laboratory ^*

ⁱ Inst Elec Electronics Engineers

^j Mount Washington Observatory   (United States)

^k IBM MICROELECTRONICS   (United States)

^l IBM   (United States)

^m SAGE   (United States)

ⁿ SMD   (United States)

^o Reliability Services   (United States)

more..

Author keywords

[No Author keywords available]

Indexed keywords

ELECTRIC CHARGE; ELECTRIC NETWORK SYNTHESIS; LSI CIRCUITS; RADIATION DAMAGE; SPURIOUS SIGNAL NOISE;

COMPUTER ELECTRONICS; SOFT FAILS;

COMPUTER CIRCUITS;

EID: 0029732375     PISSN: 00188646     EISSN: None     Source Type: Journal    
DOI: 10.1147/rd.401.0003     Document Type: Article

References (34)

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