-
1
-
-
77955184122
-
-
Landolt-Börnstein, New Series (Springer-Verlag, Berlin)
-
B. Predel, Hf-O, Landolt-Börnstein, New Series Vol. IV/5f (Springer-Verlag, Berlin, 1996).
-
(1996)
Hf-O
, vol.45
-
-
Predel, B.1
-
2
-
-
56849133819
-
-
APPLAB 0003-6951, 10.1063/1.3033526
-
H. Wang, Y. Wang, J. Zhang, C. Ye, H. B. Wang, J. Weng, B. Y. Wang, Q. Li, and Y. Jiang, Appl. Phys. Lett. APPLAB 0003-6951 93, 202904 (2008). 10.1063/1.3033526
-
(2008)
Appl. Phys. Lett.
, vol.93
, pp. 202904
-
-
Wang, H.1
Wang, Y.2
Zhang, J.3
Ye, C.4
Wang, H.B.5
Weng, J.6
Wang, B.Y.7
Li, Q.8
Jiang, Y.9
-
3
-
-
54549088943
-
-
APAMFC 0947-8396, 10.1007/s00339-008-4695-8
-
H. Wang, Y. Wang, J. Feng, C. Ye, B. Y. Wang, H. B. Wang, Q. Li, Y. Jiang, A. P. Huang, and Z. S. Xiao, Appl. Phys. A: Mater. Sci. Process. APAMFC 0947-8396 93, 681 (2008). 10.1007/s00339-008-4695-8
-
(2008)
Appl. Phys. A: Mater. Sci. Process.
, vol.93
, pp. 681
-
-
Wang, H.1
Wang, Y.2
Feng, J.3
Ye, C.4
Wang, B.Y.5
Wang, H.B.6
Li, Q.7
Jiang, Y.8
Huang, A.P.9
Xiao, Z.S.10
-
4
-
-
0037096520
-
-
PRBMDO 0163-1829, 10.1103/PhysRevB.65.233106
-
X. Zhao and D. Vanderbilt, Phys. Rev. B PRBMDO 0163-1829 65, 233106 (2002). 10.1103/PhysRevB.65.233106
-
(2002)
Phys. Rev. B
, vol.65
, pp. 233106
-
-
Zhao, X.1
Vanderbilt, D.2
-
5
-
-
0035872897
-
-
JAPIAU 0021-8979, 10.1063/1.1361065
-
G. D. Wilk, R. M. Wallace, and J. M. Anthony, J. Appl. Phys. JAPIAU 0021-8979 89, 5243 (2001). 10.1063/1.1361065
-
(2001)
J. Appl. Phys.
, vol.89
, pp. 5243
-
-
Wilk, G.D.1
Wallace, R.M.2
Anthony, J.M.3
-
6
-
-
34548039733
-
Stabilization of higher- κ tetragonal Hf O2 by Si O2 admixture enabling thermally stable metal-insulator-metal capacitors
-
DOI 10.1063/1.2771376
-
T. S. Böscke, S. Govindarajan, P. D. Kirsch, P. Y. Hung, C. Krug, B. H. Lee, J. Heitmann, U. Schröder, G. Pant, B. E. Gnade, and W. H. Krautschneider, Appl. Phys. Lett. APPLAB 0003-6951 91, 072902 (2007). 10.1063/1.2771376 (Pubitemid 47283581)
-
(2007)
Applied Physics Letters
, vol.91
, Issue.7
, pp. 072902
-
-
Boscke, T.S.1
Govindarajan, S.2
Kirsch, P.D.3
Hung, P.Y.4
Krug, C.5
Lee, B.H.6
Heitmann, J.7
Schroder, U.8
Pant, G.9
Gnade, B.E.10
Krautschneider, W.H.11
-
7
-
-
54749146790
-
-
JAPIAU 0021-8979, 10.1063/1.2978209
-
K. Cherkaoui, S. Monaghan, M. A. Negara, M. Modreanu, P. K. Hurley, D. O'Connell, S. McDonnell, G. Hughes, S. Wright, R. C. Barklie, P. Bailey, and T. C. Q. Noakes, J. Appl. Phys. JAPIAU 0021-8979 104, 064113 (2008). 10.1063/1.2978209
-
(2008)
J. Appl. Phys.
, vol.104
, pp. 064113
-
-
Cherkaoui, K.1
Monaghan, S.2
Negara, M.A.3
Modreanu, M.4
Hurley, P.K.5
O'Connell, D.6
McDonnell, S.7
Hughes, G.8
Wright, S.9
Barklie, R.C.10
Bailey, P.11
Noakes, T.C.Q.12
-
8
-
-
56949088945
-
-
VACUAV 0042-207X, 10.1016/j.vacuum.2008.08.004
-
L. Feng, Z. Liu, and Y. Shen, Vacuum VACUAV 0042-207X 83, 902 (2009). 10.1016/j.vacuum.2008.08.004
-
(2009)
Vacuum
, vol.83
, pp. 902
-
-
Feng, L.1
Liu, Z.2
Shen, Y.3
-
9
-
-
0001716014
-
-
THSFAP 0040-6090, 10.1016/0040-6090(92)90291-I
-
C. T. Kuo, R. Kwor, and K. M. Jones, Thin Solid Films THSFAP 0040-6090 213, 257 (1992). 10.1016/0040-6090(92)90291-I
-
(1992)
Thin Solid Films
, vol.213
, pp. 257
-
-
Kuo, C.T.1
Kwor, R.2
Jones, K.M.3
-
10
-
-
17944362787
-
Permittivity increase of yttrium-doped Hf O2 through structural phase transformation
-
DOI 10.1063/1.1880436, 102906
-
K. Kita, K. Kyuno, and A. Toriumi, Appl. Phys. Lett. APPLAB 0003-6951 86, 102906 (2005). 10.1063/1.1880436 (Pubitemid 40597121)
-
(2005)
Applied Physics Letters
, vol.86
, Issue.10
, pp. 1-3
-
-
Kita, K.1
Kyuno, K.2
Toriumi, A.3
-
11
-
-
34249905591
-
Effects of supercritical C O2 fluid on sputter-deposited hafnium oxide
-
DOI 10.1063/1.2743747
-
P. Liu, C. Tsai, and P. Yang, Appl. Phys. Lett. APPLAB 0003-6951 90, 223101 (2007). 10.1063/1.2743747 (Pubitemid 46872646)
-
(2007)
Applied Physics Letters
, vol.90
, Issue.22
, pp. 223101
-
-
Liu, P.-T.1
Tsai, C.-T.2
Yang, P.-Y.3
-
12
-
-
2342450573
-
-
MSBTEK 0921-5107, 10.1016/j.mseb.2003.10.053
-
L. Pereira, A. Marques, H. guas, N. Nedev, S. Georgiev, E. Fortunato, and R. Martins, Mater. Sci. Eng., B MSBTEK 0921-5107 109, 89 (2004). 10.1016/j.mseb.2003.10.053
-
(2004)
Mater. Sci. Eng., B
, vol.109
, pp. 89
-
-
Pereira, L.1
Marques, A.2
Guas, H.3
Nedev, N.4
Georgiev, S.5
Fortunato, E.6
Martins, R.7
-
13
-
-
33749076649
-
2) films
-
DOI 10.1016/j.vacuum.2006.02.003, PII S0042207X06000972
-
Z. He, W. Wu, H. Xu, J. Zhang, and Y. Tang, Vacuum VACUAV 0042-207X 81, 211 (2006). 10.1016/j.vacuum.2006.02.003 (Pubitemid 44466014)
-
(2006)
Vacuum
, vol.81
, Issue.3
, pp. 211-214
-
-
He, Z.1
Wu, W.2
Xu, H.3
Zhang, J.4
Tang, Y.5
-
14
-
-
33646704489
-
2 gate dielectric
-
DOI 10.1063/1.2202752
-
S. J. Wang, J. W. Chai, Y. F. Dong, Y. P. Feng, N. Sutanto, J. S. Pan, and A. C. H. Huan, Appl. Phys. Lett. APPLAB 0003-6951 88, 192103 (2006). 10.1063/1.2202752 (Pubitemid 43736707)
-
(2006)
Applied Physics Letters
, vol.88
, Issue.19
, pp. 192103
-
-
Wang, S.J.1
Chai, J.W.2
Dong, Y.F.3
Feng, Y.P.4
Sutanto, N.5
Pan, J.S.6
Huan, A.C.H.7
-
15
-
-
0036567727
-
Influence of annealing condition on the properties of sputtered hafnium oxide
-
DOI 10.1016/S0022-3093(02)00976-6, PII S0022309302009766
-
S. W. Nam, J. Yoo, S. Nam, H. Choi, D. Lee, D. Ko, J. Moon, J. Ku, and S. Choi, J. Non-Cryst. Solids JNCSBJ 0022-3093 303, 139 (2002). 10.1016/S0022-3093(02)00976-6 (Pubitemid 34410837)
-
(2002)
Journal of Non-Crystalline Solids
, vol.303
, Issue.1
, pp. 139-143
-
-
Nam, S.-W.1
Yoo, J.-H.2
Nam, S.3
Choi, H.-J.4
Lee, D.5
Ko, D.-H.6
Moon, J.H.7
Ku, J.-H.8
Choi, S.9
-
16
-
-
0031070434
-
-
SCTEEJ 0257-8972, 10.1016/S0257-8972(96)02913-1
-
W. D. Sproul, M. E. Graham, M. S. Wong, and P. J. Rudnik, Surf. Coat. Technol. SCTEEJ 0257-8972 89, 10 (1997). 10.1016/S0257-8972(96)02913-1
-
(1997)
Surf. Coat. Technol.
, vol.89
, pp. 10
-
-
Sproul, W.D.1
Graham, M.E.2
Wong, M.S.3
Rudnik, P.J.4
-
17
-
-
34548421962
-
High-pressure reactively sputtered Hf O2: Composition, morphology, and optical properties
-
DOI 10.1063/1.2769959
-
M. Toledano-Luque, E. San Andŕs, A. del Prado, I. Mártil, M. L. Lucía, G. González-Díaz, F. L. Martínez, W. Bohne, J. Röhrich, and E. Strub, J. Appl. Phys. JAPIAU 0021-8979 102, 044106 (2007). 10.1063/1.2769959 (Pubitemid 47352451)
-
(2007)
Journal of Applied Physics
, vol.102
, Issue.4
, pp. 044106
-
-
Toledano-Luque, M.1
San Andrs, E.2
Del Prado, A.3
Martil, I.4
Lucia, M.L.5
Gonzalez-Diaz, G.6
Martinez, F.L.7
Bohne, W.8
Rohrich, J.9
Strub, E.10
-
18
-
-
59949089215
-
-
JVTBD9 1071-1023, 10.1116/1.3043474
-
E. Hildebrandt, J. Kurian, J. Zimmermann, A. Fleissner, H. von Seggern, and L. Alff, J. Vac. Sci. Technol. B JVTBD9 1071-1023 27, 325 (2009). 10.1116/1.3043474
-
(2009)
J. Vac. Sci. Technol. B
, vol.27
, pp. 325
-
-
Hildebrandt, E.1
Kurian, J.2
Zimmermann, J.3
Fleissner, A.4
Von Seggern, H.5
Alff, L.6
-
19
-
-
33745771297
-
2 by y addition in films grown by metal organic chemical vapor deposition
-
DOI 10.1063/1.2216102
-
E. Rauwel, C. Dubourdieu, B. Holländer, N. Rochat, F. Ducroquet, M. D. Rossell, G. Van Tendeloo, and B. Pelissier, Appl. Phys. Lett. APPLAB 0003-6951 89, 012902 (2006). 10.1063/1.2216102 (Pubitemid 44025428)
-
(2006)
Applied Physics Letters
, vol.89
, Issue.1
, pp. 012902
-
-
Rauwel, E.1
Dubourdieu, C.2
Hollander, B.3
Rochat, N.4
Ducroquet, F.5
Rossell, M.D.6
Van Tendeloo, G.7
Pelissier, B.8
-
20
-
-
33749476389
-
2
-
DOI 10.1063/1.2355471
-
K. Tomida, K. Kita, and A. Toriumi, Appl. Phys. Lett. APPLAB 0003-6951 89, 142902 (2006). 10.1063/1.2355471 (Pubitemid 44522240)
-
(2006)
Applied Physics Letters
, vol.89
, Issue.14
, pp. 142902
-
-
Tomida, K.1
Kita, K.2
Toriumi, A.3
-
21
-
-
0001069323
-
-
PRBMDO 0163-1829, 10.1103/PhysRevB.49.11560
-
E. V. Stefanovich, A. L. Shluger, and C. R. A. Catlow, Phys. Rev. B PRBMDO 0163-1829 49, 11560 (1994). 10.1103/PhysRevB.49.11560
-
(1994)
Phys. Rev. B
, vol.49
, pp. 11560
-
-
Stefanovich, E.V.1
Shluger, A.L.2
Catlow, C.R.A.3
-
22
-
-
43049089408
-
Tailoring of structure formation and phase composition in reactively sputtered zirconium oxide films using nitrogen as an additional reactive gas
-
DOI 10.1063/1.2903492
-
D. Severin, K. Sarakinos, O. Kappertz, A. Pflug, and M. Wuttig, J. Appl. Phys. JAPIAU 0021-8979 103, 083306 (2008). 10.1063/1.2903492 (Pubitemid 351623522)
-
(2008)
Journal of Applied Physics
, vol.103
, Issue.8
, pp. 083306
-
-
Severin, D.1
Sarakinos, K.2
Kappertz, O.3
Pflug, A.4
Wuttig, M.5
-
24
-
-
33646186368
-
-
APPLAB 0003-6951, 10.1063/1.2196048
-
D. Severin, O. Kappertz, T. Kubart, T. Nyberg, S. Berg, A. Pflug, M. Simers, and M. Wuttig, Appl. Phys. Lett. APPLAB 0003-6951 88, 161504 (2006). 10.1063/1.2196048
-
(2006)
Appl. Phys. Lett.
, vol.88
, pp. 161504
-
-
Severin, D.1
Kappertz, O.2
Kubart, T.3
Nyberg, T.4
Berg, S.5
Pflug, A.6
Simers, M.7
Wuttig, M.8
-
25
-
-
13844309319
-
Fundamental understanding and modeling of reactive sputtering processes
-
DOI 10.1016/j.tsf.2004.10.051, PII S0040609004016876
-
S. Berg and T. Nyberg, Thin Solid Films THSFAP 0040-6090 476, 215 (2005). 10.1016/j.tsf.2004.10.051 (Pubitemid 40259151)
-
(2005)
Thin Solid Films
, vol.476
, Issue.2
, pp. 215-230
-
-
Berg, S.1
Nyberg, T.2
-
26
-
-
33646578510
-
2
-
DOI 10.1016/j.vacuum.2005.11.007, PII S0042207X05003507
-
K. Tominaga, D. Ito, and M. Miyamoto, Vacuum VACUAV 0042-207X 80, 654 (2006). 10.1016/j.vacuum.2005.11.007 (Pubitemid 43728694)
-
(2006)
Vacuum
, vol.80
, pp. 654-657
-
-
Tominaga, K.1
Ito, D.2
Miyamoto, Y.3
-
27
-
-
33746898677
-
Influence of the negative oxygen ions on the structure evolution of transition metal oxide thin films
-
DOI 10.1063/1.2216354
-
S. Mráz and J. M. Schneider, J. Appl. Phys. JAPIAU 0021-8979 100, 023503 (2006). 10.1063/1.2216354 (Pubitemid 44183349)
-
(2006)
Journal of Applied Physics
, vol.100
, Issue.2
, pp. 023503
-
-
Mraz, S.1
Schneider, J.M.2
-
28
-
-
33748450959
-
- ions during reactive magnetron sputtering
-
DOI 10.1063/1.2266888
-
S. Mráz and J. M. Schneider, Appl. Phys. Lett. APPLAB 0003-6951 89, 051502 (2006). 10.1063/1.2266888 (Pubitemid 44350217)
-
(2006)
Applied Physics Letters
, vol.89
, Issue.5
, pp. 051502
-
-
Mraz, S.1
Schneider, J.M.2
-
29
-
-
4344590038
-
-
APPLAB 0003-6951, 10.1063/1.1777412
-
J. M. Ngaruiya, O. Kappertz, S. H. Mohamed, and M. Wuttig, Appl. Phys. Lett. APPLAB 0003-6951 85, 748 (2004). 10.1063/1.1777412
-
(2004)
Appl. Phys. Lett.
, vol.85
, pp. 748
-
-
Ngaruiya, J.M.1
Kappertz, O.2
Mohamed, S.H.3
Wuttig, M.4
-
31
-
-
0000975178
-
-
SCTEEJ 0257-8972, 10.1016/S0257-8972(99)00292-3
-
V. Kouznetsov, K. Macák, J. M. Schneider, U. Helmersson, and I. Petrov, Surf. Coat. Technol. SCTEEJ 0257-8972 122, 290 (1999). 10.1016/S0257-8972(99)00292-3
-
(1999)
Surf. Coat. Technol.
, vol.122
, pp. 290
-
-
Kouznetsov, V.1
MacÁk, K.2
Schneider, J.M.3
Helmersson, U.4
Petrov, I.5
-
32
-
-
33746937174
-
Ionized physical vapor deposition (IPVD): A review of technology and applications
-
DOI 10.1016/j.tsf.2006.03.033, PII S0040609006004317
-
U. Helmersson, M. Lattemann, J. Bohlmark, A. P. Ehiasarian, and J. T. Gudmundsson, Thin Solid Films THSFAP 0040-6090 513, 1 (2006). 10.1016/j.tsf.2006.03.033 (Pubitemid 44202356)
-
(2006)
Thin Solid Films
, vol.513
, Issue.1-2
, pp. 1-24
-
-
Helmersson, U.1
Lattemann, M.2
Bohlmark, J.3
Ehiasarian, A.P.4
Gudmundsson, J.T.5
-
33
-
-
74849100570
-
-
SCTEEJ 0257-8972, 10.1016/j.surfcoat.2009.11.013
-
K. Sarakinos, J. Alami, and S. Konstantinidis, Surf. Coat. Technol. SCTEEJ 0257-8972 204, 1661 (2010). 10.1016/j.surfcoat.2009.11.013
-
(2010)
Surf. Coat. Technol.
, vol.204
, pp. 1661
-
-
Sarakinos, K.1
Alami, J.2
Konstantinidis, S.3
-
34
-
-
44449150711
-
-
THSFAP 0040-6090, 10.1016/j.tsf.2007.08.123
-
E. Wallin and U. Helmersson, Thin Solid Films THSFAP 0040-6090 516, 6398 (2008). 10.1016/j.tsf.2007.08.123
-
(2008)
Thin Solid Films
, vol.516
, pp. 6398
-
-
Wallin, E.1
Helmersson, U.2
-
35
-
-
50349099478
-
-
SCTEEJ 0257-8972, 10.1016/j.surfcoat.2008.05.009
-
K. Sarakinos, J. Alami, C. Klever, and M. Wuttig, Surf. Coat. Technol. SCTEEJ 0257-8972 202, 5033 (2008). 10.1016/j.surfcoat.2008.05.009
-
(2008)
Surf. Coat. Technol.
, vol.202
, pp. 5033
-
-
Sarakinos, K.1
Alami, J.2
Klever, C.3
Wuttig, M.4
-
36
-
-
77955223051
-
-
MELEC GmbH, U.S. Patent No. US 6,735,099 B2 (17 April)
-
MELEC GmbH, U.S. Patent No. US 6,735,099 B2 (17 April 2001).
-
(2001)
-
-
-
37
-
-
33750082095
-
On the deposition rate in a high power pulsed magnetron sputtering discharge
-
DOI 10.1063/1.2362575
-
J. Alami, K. Sarakinos, G. Mark, and M. Wuttig, Appl. Phys. Lett. APPLAB 0003-6951 89, 154104 (2006). 10.1063/1.2362575 (Pubitemid 44574355)
-
(2006)
Applied Physics Letters
, vol.89
, Issue.15
, pp. 154104
-
-
Alami, J.1
Sarakinos, K.2
Mark, G.3
Wuttig, M.4
-
38
-
-
10644250257
-
-
PRVAAH 0096-8250, 10.1103/PhysRev.136.B864
-
P. Hohenberg and W. Kohn, Phys. Rev. PRVAAH 0096-8250 136, B864 (1964). 10.1103/PhysRev.136.B864
-
(1964)
Phys. Rev.
, vol.136
, pp. 864
-
-
Hohenberg, P.1
Kohn, W.2
-
39
-
-
35949007146
-
-
PRBMDO 0163-1829, 10.1103/PhysRevB.48.13115
-
G. Kresse and J. Hafner, Phys. Rev. B PRBMDO 0163-1829 48, 13115 (1993). 10.1103/PhysRevB.48.13115
-
(1993)
Phys. Rev. B
, vol.48
, pp. 13115
-
-
Kresse, G.1
Hafner, J.2
-
40
-
-
27744460065
-
-
PRBMDO 0163-1829, 10.1103/PhysRevB.49.14251
-
G. Kresse and J. Hafner, Phys. Rev. B PRBMDO 0163-1829 49, 14251 (1994). 10.1103/PhysRevB.49.14251
-
(1994)
Phys. Rev. B
, vol.49
, pp. 14251
-
-
Kresse, G.1
Hafner, J.2
-
41
-
-
1842816907
-
-
PRBMDO 0163-1829, 10.1103/PhysRevB.13.5188
-
H. J. Monkhorst and J. D. Pack, Phys. Rev. B PRBMDO 0163-1829 13, 5188 (1976). 10.1103/PhysRevB.13.5188
-
(1976)
Phys. Rev. B
, vol.13
, pp. 5188
-
-
Monkhorst, H.J.1
Pack, J.D.2
-
42
-
-
25744460922
-
-
PRBMDO 0163-1829, 10.1103/PhysRevB.50.17953
-
P. E. Blöchl, Phys. Rev. B PRBMDO 0163-1829 50, 17953 (1994). 10.1103/PhysRevB.50.17953
-
(1994)
Phys. Rev. B
, vol.50
, pp. 17953
-
-
Blöchl, P.E.1
-
43
-
-
0000214080
-
-
PRLTAO 0031-9007, 10.1103/PhysRevLett.65.353
-
A. Zunger, S. H. Wei, L. G. Ferreira, and J. E. Bernard, Phys. Rev. Lett. PRLTAO 0031-9007 65, 353 (1990). 10.1103/PhysRevLett.65.353
-
(1990)
Phys. Rev. Lett.
, vol.65
, pp. 353
-
-
Zunger, A.1
Wei, S.H.2
Ferreira, L.G.3
Bernard, J.E.4
-
44
-
-
36849141119
-
-
JAPIAU 0021-8979, 10.1063/1.1699415
-
J. M. Cowley, J. Appl. Phys. JAPIAU 0021-8979 21, 24 (1950). 10.1063/1.1699415
-
(1950)
J. Appl. Phys.
, vol.21
, pp. 24
-
-
Cowley, J.M.1
-
45
-
-
0001527265
-
-
PRLTAO 0031-9007, 10.1103/PhysRevLett.76.4203
-
I. A. Abrikosov, A. M. N. Niklasson, S. I. Simak, B. Johansson, A. V. Ruban, and H. L. Skriver, Phys. Rev. Lett. PRLTAO 0031-9007 76, 4203 (1996). 10.1103/PhysRevLett.76.4203
-
(1996)
Phys. Rev. Lett.
, vol.76
, pp. 4203
-
-
Abrikosov, I.A.1
Niklasson, A.M.N.2
Simak, S.I.3
Johansson, B.4
Ruban, A.V.5
Skriver, H.L.6
-
46
-
-
0000235569
-
-
PRBMDO 0163-1829, 10.1103/PhysRevB.56.9319
-
I. A. Abrikosov, S. I. Simak, B. Johansson, A. V. Ruban, and H. L. Skriver, Phys. Rev. B PRBMDO 0163-1829 56, 9319 (1997). 10.1103/PhysRevB.56.9319
-
(1997)
Phys. Rev. B
, vol.56
, pp. 9319
-
-
Abrikosov, I.A.1
Simak, S.I.2
Johansson, B.3
Ruban, A.V.4
Skriver, H.L.5
-
51
-
-
0003459529
-
-
(Perkin-Elmer, Eden Prairie)
-
J. F. Moulder, W. F. Stickle, P. E. Sobol, and K. D. Bomben, Handbook of X-ray Photoelectron Spectroscopy (Perkin-Elmer, Eden Prairie, 1992).
-
(1992)
Handbook of X-ray Photoelectron Spectroscopy
-
-
Moulder, J.F.1
Stickle, W.F.2
Sobol, P.E.3
Bomben, K.D.4
-
52
-
-
84980125820
-
-
JACTAW 0002-7820, 10.1111/j.1151-2916.1954.tb13977.x
-
C. E. Curtis, L. M. Doney, and J. R. Johnson, J. Am. Ceram. Soc. JACTAW 0002-7820 37, 458 (1954). 10.1111/j.1151-2916.1954.tb13977.x
-
(1954)
J. Am. Ceram. Soc.
, vol.37
, pp. 458
-
-
Curtis, C.E.1
Doney, L.M.2
Johnson, J.R.3
-
53
-
-
0000735254
-
-
ABCRE6 0907-4449, 10.1107/S0365110X59002742
-
J. Adam and M. D. Rogers, Acta Crystallogr. ABCRE6 0907-4449 12, 951 (1959). 10.1107/S0365110X59002742
-
(1959)
Acta Crystallogr.
, vol.12
, pp. 951
-
-
Adam, J.1
Rogers, M.D.2
-
54
-
-
33846903612
-
The effect of target aging on the structure formation of zinc oxide during reactive sputtering
-
DOI 10.1016/j.tsf.2006.10.130, PII S0040609006013137
-
D. Severin, O. Kappertz, T. Nyberg, S. Berg, and M. Wuttig, Thin Solid Films THSFAP 0040-6090 515, 3554 (2007). 10.1016/j.tsf.2006.10.130 (Pubitemid 46240204)
-
(2007)
Thin Solid Films
, vol.515
, Issue.7-8
, pp. 3554-3558
-
-
Severin, D.1
Kappertz, O.2
Nyberg, T.3
Berg, S.4
Wuttig, M.5
-
55
-
-
0035465602
-
Structural modifications of hafnium oxide films prepared by ion beam assisted deposition under high energy oxygen irradation
-
DOI 10.1016/S0257-8972(01)01392-5, PII S0257897201013925
-
S. Miyake, I. Shimizu, R. R. Manory, T. Mori, and G. Kimmel, Surf. Coat. Technol. SCTEEJ 0257-8972 146-147, 237 (2001). 10.1016/S0257-8972(01)01392-5 (Pubitemid 34018611)
-
(2001)
Surface and Coatings Technology
, vol.146-147
, pp. 237-242
-
-
Miyake, S.1
Shimizu, I.2
Manory, R.R.3
Mori, T.4
Kimmel, G.5
-
56
-
-
67651247333
-
-
APPLAB 0003-6951, 10.1063/1.3184577
-
Y. Wang, H. Wang, J. Zhang, H. Wang, C. Ye, Y. Yiang, and Q. Wang, Appl. Phys. Lett. APPLAB 0003-6951 95, 032905 (2009). 10.1063/1.3184577
-
(2009)
Appl. Phys. Lett.
, vol.95
, pp. 032905
-
-
Wang, Y.1
Wang, H.2
Zhang, J.3
Wang, H.4
Ye, C.5
Yiang, Y.6
Wang, Q.7
-
57
-
-
51849115031
-
-
APPLAB 0003-6951, 10.1063/1.2969061
-
Y. Chen, Y. P. Feng, J. W. Chai, Z. Zhang, J. S. Pan, and S. J. Wang, Appl. Phys. Lett. APPLAB 0003-6951 93, 052104 (2008). 10.1063/1.2969061
-
(2008)
Appl. Phys. Lett.
, vol.93
, pp. 052104
-
-
Chen, Y.1
Feng, Y.P.2
Chai, J.W.3
Zhang, Z.4
Pan, J.S.5
Wang, S.J.6
|