Formation of optical gradient in chemical solution-derived Pb Zr 0.52 Ti0.48 O3 thin films: Spectroscopic ellipsometry investigation

Journal of the Electrochemical Society

Volumn 156, Issue 12, 2009, Pages

  Aulika, I ^a   Corkovic, S ^b   Bencan, A ^c   D'Astorg, S ^b   Dejneka, A ^d   Zhang, Q ^b   Kosec, M ^c   Zauls, V ^a  

^a UNIVERSITY OF LATVIA   (Latvia)

^b CRANFIELD UNIVERSITY   (United Kingdom)

^c JO EF STEFAN INSTITUTE   (Slovenia)

^d INSTITUTE OF PHYSICS   (Czech Republic)

Author keywords

[No Author keywords available]

Indexed keywords

CHEMICAL SOLUTIONS; COMPLEX DIELECTRIC FUNCTIONS; ENERGY DISPERSIVE X-RAY SPECTROSCOPY; LATTICE PARAMETERS; PHONON ENERGIES; PZT; REFINED ANALYSIS; REFRACTIVE INDEX GRADIENTS; SAMPLE PREPARATION; SPECTROSCOPIC ELLIPSOMETERS;

PIEZOELECTRIC ACTUATORS; PIEZOELECTRIC MATERIALS; PIEZOELECTRIC TRANSDUCERS; REFRACTIVE INDEX; SEMICONDUCTING LEAD COMPOUNDS; SPECTROSCOPIC ELLIPSOMETRY; THIN FILM DEVICES; THIN FILMS; X RAY SPECTROSCOPY;

ZIRCONIUM;

EID: 70350716221     PISSN: 00134651     EISSN: None     Source Type: Journal    
DOI: 10.1149/1.3240580     Document Type: Article

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