Optical gradient of the trapezium-shaped NaNb O3 thin films studied by spectroscopic ellipsometry

Journal of the Electrochemical Society

Volumn 155, Issue 10, 2008, Pages

  Aulika, I ^a   Dejneka, A ^b   Zauls, V ^a   Kundzins, K ^a  

^a UNIVERSITY OF LATVIA   (Latvia)

^b INSTITUTE OF PHYSICS   (Czech Republic)

Author keywords

[No Author keywords available]

Indexed keywords

CHLORINE COMPOUNDS; ELLIPSOMETRY; GRADIENT METHODS; LIGHT REFRACTION; OPTICAL PROPERTIES; OZONE WATER TREATMENT; REFRACTIVE INDEX; REFRACTOMETERS; SPECTROSCOPIC ELLIPSOMETRY; THICK FILMS; THIN FILMS;

COMPLEX REFRACTIVE INDEX; DEPTH PROFILING; NON UNIFORMITIES; OPTICAL-; PHOTON ENERGY RANGE; REAL PART; SAMPLE THICKNESS;

MOLECULAR BEAM EPITAXY;

EID: 51849146162     PISSN: 00134651     EISSN: None     Source Type: Journal    
DOI: 10.1149/1.2965786     Document Type: Article

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