Optical thin-film materials with low refractive index for broadband elimination of Fresnel reflection

Nature Photonics

Volumn 1, Issue 3, 2007, Pages 176-179

  Xi, J Q ^a   Schubert, Martin F ^a   Kim, Jong Kyu ^a   Schubert, E Fred ^a   Chen, Minfeng ^a,b   Lin, Shawn Yu ^a   Liu, W ^c   Smart, J A ^c  

^a RENSSELAER POLYTECHNIC INSTITUTE   (United States)

^b NATIONAL TAIWAN UNIVERSITY   (Taiwan)

^c Crystal IS Inc   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

AMBIENT MEDIUM; BROADBAND ANTI REFLECTIONS; FRESNEL REFLECTIONS; LOW REFRACTIVE INDEX; NANOROD LAYERS; OBLIQUE-ANGLE DEPOSITION; OPTICAL THIN FILMS; REFRACTIVE INDEX OF AIR;

ANTIREFLECTION COATINGS; COATINGS; INTERFACES (MATERIALS); NANORODS; SILICA;

REFRACTIVE INDEX;

EID: 34248332216     PISSN: 17494885     EISSN: 17494893     Source Type: Journal    
DOI: 10.1038/nphoton.2007.26     Document Type: Article

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