Optical properties of Pb(ZrxTi1-x)O3 (x = 0.4, 0.6) thin films on Pt-coated Si substrates studied by spectroscopic ellipsometry

Materials Chemistry and Physics

Volumn 103, Issue 2-3, 2007, Pages 329-333

  Tang, X G ^a,b   Liu, Q X ^b   Jiang, L L ^b   Ding, A L ^c  

^a GUANGXI UNIVERSITY FOR NATIONALITIES   (China)

^b GUANGDONG UNIVERSITY OF TECHNOLOGY   (China)

^c SHANGHAI INSTITUTE OF CERAMICS   (China)

Author keywords

Ellipsometry; Optical properties; PZT thin films; Sol gel growth

Indexed keywords

ATOMIC FORCE MICROSCOPY; GRAIN SIZE AND SHAPE; LEAD COMPOUNDS; REFRACTIVE INDEX; SOL-GEL PROCESS; SPECTROSCOPIC ELLIPSOMETRY; SURFACE MORPHOLOGY; X RAY DIFFRACTION;

EXTINCTION COEFFICIENT; LEAD ZIRCONATE TITANATE; ROOT MEAN SQUARE ROUGHNESS;

THIN FILMS;

EID: 34248668450     PISSN: 02540584     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.matchemphys.2007.02.065     Document Type: Article

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