Relationships among surface processing at the nanometer scale, nanostructure and optical properties of thin oxide films

Thin Solid Films

Volumn 455-456, Issue , 2004, Pages 301-312

  Losurdo, Maria ^a  

^a UNIVERSITY OF BARI   (Italy)

Author keywords

Anisotropy; Nanostructured oxides; Parameterization of optical functions; Polarity

Indexed keywords

ANISOTROPY; DIELECTRIC PROPERTIES; ELLIPSOMETRY; NANOSTRUCTURED MATERIALS; OPTICAL PROPERTIES; OSCILLATIONS; OXYGEN; SURFACE TREATMENT;

NANOSTRUCTURED OXIDES; PARAMETERIZATION OF OPTICAL FUNCTIONS; POLARITY; SPECTROSCOPIC ELLIPSOMETRY;

THIN FILMS;

EID: 17144454990     PISSN: 00406090     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.tsf.2003.11.196     Document Type: Conference Paper

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