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Thin Solid Films

Volumn 352, Issue 1-2, 1999, Pages 205-212

The sensitivity limits of spectroscopic ellipsometry to oxygen content in YBa2Cu3O7-δ thin films

(2) Gibbons, B J a Trolier McKinstry, S a

a PENNSYLVANIA STATE UNIVERSITY (United States)

Author keywords

Oxygen content; Spectroscopic ellipsometry; YBa2Cu3O7

Indexed keywords

EID: 0009192268 PISSN: 00406090 EISSN: None Source Type: Journal
DOI: 10.1016/S0040-6090(99)00279-5 Document Type: Article

Times cited : (4)

References (32)

1
- 0001542941
- M.K. Kelly, P. Barboux, J.-M. Tarascon, D.E. Aspnes, W.A. Bonner, P.A. Morris, Phys. Rev. B 38 (1988) 870.
- (1988) Phys. Rev. B , vol.38 , pp. 870
- Kelly, M.K.¹ Barboux, P.² Tarascon, J.-M.³ Aspnes, D.E.⁴ Bonner, W.A.⁵ Morris, P.A.⁶

2
- 0024029619
- M. Garriga, J. Humlicek, M. Cardona, E. Schönherr, Sol. State Comm. 66 (1988) 1231.
- (1988) Sol. State Comm. , vol.66 , pp. 1231
- Garriga, M.¹ Humlicek, J.² Cardona, M.³ Schönherr, E.⁴

3
- 0001689809
- J. Kircher, M.K. Kelly, S. Rashkeev, M. Alouani, D. Fuchs, M. Cardona, Phys. Rev. B 44 (1991) 217.
- (1991) Phys. Rev. B , vol.44 , pp. 217
- Kircher, J.¹ Kelly, M.K.² Rashkeev, S.³ Alouani, M.⁴ Fuchs, D.⁵ Cardona, M.⁶

4
- 26544469401
- W.A.M. Aarnink, R.P.J. IJsselsteijn, J. Gao, A. van Silfhout, H. Rogalla, Phys. Rev. B 45 (1992) 13.
- (1992) Phys. Rev. B , vol.45 , pp. 13
- Aarnink, W.A.M.¹ Ijsselsteijn, R.P.J.² Gao, J.³ Van Silfhout, A.⁴ Rogalla, H.⁵

5
- 0347255287
- B.J. Gibbons, S. Trolier-McKinstry, D.G. Schlom, C.B. Eom, MRS Symp. Proc., 401 (1995) 333.
- (1995) MRS Symp. Proc. , vol.401 , pp. 333
- Gibbons, B.J.¹ Trolier-McKinstry, S.² Schlom, D.G.³ Eom, C.B.⁴

6
- 0347885704
- Ph.D. Thesis, University of Twente, Enschede, The Netherlands
- M.E. Bijlsma, An in situ ellipsometric study of high-Tc superconducting thin film growth, Ph.D. Thesis, University of Twente, Enschede, The Netherlands, (1996).
- (1996) An in Situ Ellipsometric Study of High-Tc Superconducting Thin Film Growth
- Bijlsma, M.E.¹

7
- 0000542255
- C.T. Rogers, A. Inam, M.S. Hegde, B. Dutta, X.D. Wu, T. Venkatesan, Appl. Phys. Lett. 55 (1989) 2032.
- (1989) Appl. Phys. Lett. , vol.55 , pp. 2032
- Rogers, C.T.¹ Inam, A.² Hegde, M.S.³ Dutta, B.⁴ Wu, X.D.⁵ Venkatesan, T.⁶

8
- 21544439029
- R.H. Ono, J.A. Beall, M.W. Cromar, T.E. Harvey, M.E. Johansson, C.D. Reintsema, D.A. Rudman, Appl. Phys. Lett. 59 (1991) 1126.
- (1991) Appl. Phys. Lett. , vol.59 , pp. 1126
- Ono, R.H.¹ Beall, J.A.² Cromar, M.W.³ Harvey, T.E.⁴ Johansson, M.E.⁵ Reintsema, C.D.⁶ Rudman, D.A.⁷

9
- 0001718792
- M.E. Klausmeier-Brown, G.F. Virshup, I. Bozovic, J.N. Eckstein, K.S. Ralls, Appl. Phys. Lett. 60 (1992) 2806.
- (1992) Appl. Phys. Lett. , vol.60 , pp. 2806
- Klausmeier-Brown, M.E.¹ Virshup, G.F.² Bozovic, I.³ Eckstein, J.N.⁴ Ralls, K.S.⁵

10
- 0039241408
- P.A. Rosenthal, E.N. Grossman, R.H. Ono, L.R. Vale, Appl. Phys. Lett. 63 (1993) 1984.
- (1993) Appl. Phys. Lett. , vol.63 , pp. 1984
- Rosenthal, P.A.¹ Grossman, E.N.² Ono, R.H.³ Vale, L.R.⁴

11
- 0009263950
- A.W. Kleinsasser, K.A. Delin, Appl. Phys. Lett. 66 (1995) 102.
- (1995) Appl. Phys. Lett. , vol.66 , pp. 102
- Kleinsasser, A.W.¹ Delin, K.A.²

12
- 0030166140
- B.D. Hunt, M.G. Forrester, J. Talvacchio, J.D. McCambridge, R.M. Young, Appl. Phys. Lett. 68 (1996) 3805.
- (1996) Appl. Phys. Lett. , vol.68 , pp. 3805
- Hunt, B.D.¹ Forrester, M.G.² Talvacchio, J.³ McCambridge, J.D.⁴ Young, R.M.⁵

13
- 0030113704
- K.A. Delin, A.W. Kleinsasser, Supercond. Sci. Technol. 9 (1996) 227.
- (1996) Supercond. Sci. Technol. , vol.9 , pp. 227
- Delin, K.A.¹ Kleinsasser, A.W.²

14
- 0012955842
- Secondary Ion Mass Spectroscopy
- ASM International
- C.G. Pantano, Secondary Ion Mass Spectroscopy, in Materials Characterization, 1986, ASM International, p. 610.
- (1986) Materials Characterization , pp. 610
- Pantano, C.G.¹

15
- 0010806079
- W.K. Chu, G. Langouche, MRS Bull. 18 (1993) 32.
- (1993) MRS Bull. , vol.18 , pp. 32
- Chu, W.K.¹ Langouche, G.²

16
- 0345994208
- Auger Electron Spectroscopy
- ASM International
- A. Joshi, Auger Electron Spectroscopy, in: Materials characterization, 1986, ASM International, p. 549.
- (1986) Materials Characterization , pp. 549
- Joshi, A.¹

17
- 0032001178
- R.W. Collins, I. An, H. Fujiwara, J. Lee, Y. Lu, J. Koh, P.I. Rovira, Thin Solid Films 313-314 (1998) 18.
- (1998) Thin Solid Films , vol.313-314 , pp. 18
- Collins, R.W.¹ An, I.² Fujiwara, H.³ Lee, J.⁴ Lu, Y.⁵ Koh, J.⁶ Rovira, P.I.⁷

18
- 36449000302
- D.E. Aspnes, W.E. Quinn, M.C. Tamargo, et al., Appl. Phys. Lett. 60 (1992) 1244.
- (1992) Appl. Phys. Lett. , vol.60 , pp. 1244
- Aspnes, D.E.¹ Quinn, W.E.² Tamargo, M.C.³

19
- 0007038948
- D.E. Aspnes, W.E. Quinn, S. Gregory, Appl. Phys. Lett. 57 (1990) 2707.
- (1990) Appl. Phys. Lett. , vol.57 , pp. 2707
- Aspnes, D.E.¹ Quinn, W.E.² Gregory, S.³

20
- 84975539429
- P. Chindaudom, K. Vedam, Opt. Lett. 17 (1992) 538.
- (1992) Opt. Lett. , vol.17 , pp. 538
- Chindaudom, P.¹ Vedam, K.²

21
- 0031163253
- B.J. Gibbons, S. Trolier-McKinstry, IEEE Trans. Appl. Supercon. 7 (1997) 2177.
- (1997) IEEE Trans. Appl. Supercon. , vol.7 , pp. 2177
- Gibbons, B.J.¹ Trolier-McKinstry, S.²

22
- 0029373976
- S. Trolier-McKinstry, P. Chindaudom, K. Vedam, B.V. Hiremath, J. Am. Cer. Soc. 78 (1995) 2412.
- (1995) J. Am. Cer. Soc. , vol.78 , pp. 2412
- Trolier-McKinstry, S.¹ Chindaudom, P.² Vedam, K.³ Hiremath, B.V.⁴

23
- 0027682165
- G.E. Jellison, Thin Solid Films 234 (1993) 416.
- (1993) Thin Solid Films , vol.234 , pp. 416
- Jellison, G.E.¹

24
- 0010284823
- A.N. Parikh, D.L. Allara, J. Chem. Phys. 96 (1992) 927.
- (1992) J. Chem. Phys. , vol.96 , pp. 927
- Parikh, A.N.¹ Allara, D.L.²

25
- 0006535076
- 3)
- Academic Press, Boston
- 3), Handbook of Optical Constants of Solids II, Academic Press, Boston, 1991 p. 1035.
- (1991) Handbook of Optical Constants of Solids II , pp. 1035
- Gervais, F.¹

26
- 0347885695
- submitted for publication
- J.-P. Maria, B.J. Gibbons, S. Trolier-McKinstry, Appl. Phys. Lett., (1999) submitted for publication.
- (1999) Appl. Phys. Lett.
- Maria, J.-P.¹ Gibbons, B.J.² Trolier-McKinstry, S.³

27
- 0001583920
- R.W. Collins, Rev. Sci. Instrum. 61 (1990) 2029.
- (1990) Rev. Sci. Instrum. , vol.61 , pp. 2029
- Collins, R.W.¹

28
- 0347255272
- Ph.D. Thesis, The Pennsylvania State University, University Park
- P. Chindaudom, Characterization of inhomogeneous transparent thin films on transparent substrates by spectroscopic ellipsometry, Ph.D. Thesis, The Pennsylvania State University, University Park, 1991.
- (1991) Characterization of Inhomogeneous Transparent Thin Films on Transparent Substrates by Spectroscopic Ellipsometry
- Chindaudom, P.¹

29
- 0003840268
- Academic Press, San Diego
- I.P. Herman, Optical Diagnostics for Thin Film Processing. Academic Press, San Diego, 1996, p. 441.
- (1996) Optical Diagnostics for Thin Film Processing , pp. 441
- Herman, I.P.¹

30
- 0000012726
- C.B. Eom, A.F. Marshall, S.S. Laderman, R.D. Jacowitz, T.H. Geballe, Science 249 (1990) 1549.
- (1990) Science , vol.249 , pp. 1549
- Eom, C.B.¹ Marshall, A.F.² Laderman, S.S.³ Jacowitz, R.D.⁴ Geballe, T.H.⁵

31
- 0029747562
- S. Trolier-McKinstry, J. Koh, MRS Symp. Proc. 411 (1996) 185.
- (1996) MRS Symp. Proc. , vol.411 , pp. 185
- Trolier-McKinstry, S.¹ Koh, J.²

32
- 0005082164
- A. Michaelis, E.A. Irene, O. Auciello, A.R. Krauss, J. Appl. Phys. 83 (1998) 7736.
- (1998) J. Appl. Phys. , vol.83 , pp. 7736
- Michaelis, A.¹ Irene, E.A.² Auciello, O.³ Krauss, A.R.⁴

* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.