Quantitative X-Ray spectrum imaging of lead lanthanum zirconate titanate PLZT thin-films

Journal of the American Ceramic Society

Volumn 91, Issue 11, 2008, Pages 3690-3697

  Parish, Chad M ^a   Brennecka, Geoff L ^a   Tuttle, Bruce A ^a   Brewer, Luke N ^a  

^a SANDIA NATIONAL LABORATORIES   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

CHEMICAL ANALYSIS; CHEMICAL PROPERTIES; CRYSTALLIZATION; ELECTRIC PROPERTIES; EXPLOSIVE ACTUATED DEVICES; LANTHANUM; LEAD; LEAD ALLOYS; MICROSCOPIC EXAMINATION; MULTIVARIANT ANALYSIS; NANOCRYSTALLINE ALLOYS; PHOTODEGRADATION; PIEZOELECTRIC TRANSDUCERS; POSITIVE IONS; SCANNING ELECTRON MICROSCOPY; SEGREGATION (METALLOGRAPHY); THICK FILMS; THIN FILMS; TRANSMISSION ELECTRON MICROSCOPY; TWO DIMENSIONAL; X RAY ANALYSIS; ZIRCONIUM;

2D ANALYSIS; ANNEAL PROCESSES; APPLICATIONS.; CATION DISTRIBUTIONS; CHEMICAL INFORMATIONS; CHEMICAL SOLUTION DEPOSITIONS; DEGRADED PROPERTIES; ELECTRICAL PROPERTIES; HIGH PERMITTIVITIES; HIGH RESOLUTIONS; IMPROVED PROCESSING; INTEGRATED CAPACITORS; LEAD LANTHANUM ZIRCONATE TITANATES; MULTIVARIATE STATISTICAL ANALYSIS; QUANTITATIVE ANALYSES; SCANNING TRANSMISSION ELECTRON MICROSCOPIES; SPECTRUM IMAGES;

ELECTRON ENERGY LOSS SPECTROSCOPY;

EID: 56749168626     PISSN: 00027820     EISSN: 15512916     Source Type: Journal    
DOI: 10.1111/j.1551-2916.2008.02708.x     Document Type: Article

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