The atomic origins of reduced critical currents at [001] tilt grain boundaries in YBa2Cu3O7-δ thin films

Physica C: Superconductivity and its Applications

Volumn 294, Issue 3-4, 1998, Pages 183-193

  Browning, N D ^a   Buban, J P ^a   Nellist, P D ^b,c   Norton, D P ^b   Chisholm, M F ^b   Pennycook, S J ^b  

^a UNIVERSITY OF ILLINOIS AT CHICAGO   (United States)

^b OAK RIDGE NATIONAL LABORATORY   (United States)

^c UNIVERSITY OF CAMBRIDGE   (United Kingdom)

Author keywords

EELS; Grain boundaries; STEM; Transport properties; Z contrast

Indexed keywords

CHEMICAL BONDS; CRITICAL CURRENT DENSITY (SUPERCONDUCTIVITY); CRYSTAL ORIENTATION; DISLOCATIONS (CRYSTALS); ELECTRON ENERGY LOSS SPECTROSCOPY; ELECTRON TRANSPORT PROPERTIES; ELECTRONIC STRUCTURE; GRAIN BOUNDARIES; OXIDE SUPERCONDUCTORS; TRANSMISSION ELECTRON MICROSCOPY; YTTRIUM COMPOUNDS;

ATOMIC RESOLUTION Z CONTRAST IMAGING; BON VALNECE SUM ANALYSIS;

SUPERCONDUCTING FILMS;

EID: 0031703181     PISSN: 09214534     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0921-4534(97)01689-4     Document Type: Article

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