System-level throughput analysis for process variation aware multiple voltage-frequency island designs

ACM Transactions on Design Automation of Electronic Systems

Volumn 13, Issue 4, 2008, Pages

  Garg, Siddharth ^a   Marculescu, Diana ^a  

^a CARNEGIE MELLON UNIVERSITY   (United States)

Author keywords

Globally asynchronous locally synchronous; Manufacturing process variations; Maximum cycle mean; Performance analysis; System level design; Voltage frequency islands

Indexed keywords

GLOBALLY ASYNCHRONOUS LOCALLY SYNCHRONOUS; MANUFACTURING PROCESS VARIATIONS; MAXIMUM CYCLE MEAN; PERFORMANCE ANALYSIS; SYSTEM-LEVEL DESIGN; VOLTAGE-FREQUENCY ISLANDS;

DESIGN; INDUSTRIAL ENGINEERING; LANDFORMS; MOTION PICTURE EXPERTS GROUP STANDARDS; PROBABILITY DISTRIBUTIONS; PRODUCTION ENGINEERING; RISK ASSESSMENT; THROUGHPUT;

PROCESS ENGINEERING;

EID: 53849083495     PISSN: 10844309     EISSN: 15577309     Source Type: Journal    
DOI: 10.1145/1391962.1391967     Document Type: Article

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