A statistical framework for post-silicon tuning through body bias clustering

IEEE/ACM International Conference on Computer-Aided Design, Digest of Technical Papers, ICCAD

Volumn , Issue , 2006, Pages 39-46

  Kulkarni, Sarvesh H ^a   Sylvester, Dennis ^a   Blaauw, David ^a  

^a University of Michigan   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

DESIGN; DIES; FLOW OF SOLIDS; LEAKAGE CURRENTS; PROBABILITY DISTRIBUTIONS; STANDARDS; STATISTICS; TUNING;

(100) SILICON; ADAPTIVE BODY BIASING (ABB); BIAS CONTROL; BODY BIASING; CLUSTERING TECHNIQUES; COMPUTER-AIDED DESIGN; DESIGN TIME; DUAL-THRESHOLD VOLTAGE ASSIGNMENT; EFFICIENT SAMPLING; INDIVIDUAL (PSS 544-7); INTERNATIONAL CONFERENCES; LEAKAGE POWER; OPTIMAL PERFORMANCES; PHYSICAL DESIGNS; POWER CHARACTERISTICS; POWER CONSTRAINTS; STANDARD DEVIATION (STD); STATISTICAL FRAMEWORK; WIRE LENGTHS;

SILICON;

EID: 41549118981     PISSN: 10923152     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/ICCAD.2006.320103     Document Type: Conference Paper

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