Critical shape and size for dislocation nucleation in si1-xGex islands on Si(001)

Physical Review Letters

Volumn 99, Issue 23, 2007, Pages

  Marzegalli, A ^a   Zinovyev, V A ^a,d   Montalenti, F ^a   Rastelli, A ^b,c   Stoffel, M ^b   Merdzhanova, T ^b   Schmidt, O G ^b,c   Miglio, Leo ^a  

^a UNIVERSITY OF MILANO BICOCCA   (Italy)

^b MAX PLANCK INSTITUT FÜR FESTKÖRPERFORSCHUNG   (Germany)

^c IFW DRESDEN   (Germany)

^d INSTITUTE OF SEMICONDUCTOR PHYSICS   (Russian Federation)

Author keywords

[No Author keywords available]

Indexed keywords

ATOMIC FORCE MICROSCOPY; MATHEMATICAL MODELS; PLASTIC DEFORMATION; SILICON COMPOUNDS; STRAIN RELAXATION; THREE DIMENSIONAL;

BARNLIKE ISLANDS; CRITICAL VOLUMES; DISLOCATION ENERGY; PLANAR FILMS;

NUCLEATION;

EID: 36849056059     PISSN: 00319007     EISSN: 10797114     Source Type: Journal    
DOI: 10.1103/PhysRevLett.99.235505     Document Type: Article

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