SCOPUS 정보 검색 플랫폼

Volumn 92, Issue 3, 2008, Pages

Electron tomography of embedded semiconductor quantum dot

Author keywords

[No Author keywords available]

Indexed keywords

FOCUSED ION BEAMS; IMAGE RECONSTRUCTION; SEMICONDUCTING GALLIUM ARSENIDE; TOMOGRAPHY; TRANSMISSION ELECTRON MICROSCOPY;

ANISOTROPIC STRUCTURE; ELECTRON TOMOGRAPHY; INDIUM DISTRIBUTION;

SEMICONDUCTOR QUANTUM DOTS;

EID: 38549134373 PISSN: 00036951 EISSN: None Source Type: Journal
DOI: 10.1063/1.2837453 Document Type: Article

Times cited : (46)

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