SCOPUS 정보 검색 플랫폼

Volumn 90, Issue 26, 2007, Pages

Investigation of the chemical composition profile of SiGeSi (001) islands by analytical transmission electron microscopy

Author keywords

[No Author keywords available]

Indexed keywords

ELECTRON ENERGY LOSS SPECTROSCOPY; SEMICONDUCTING SILICON; SEMICONDUCTOR GROWTH; THIN FILMS; TRANSMISSION ELECTRON MICROSCOPY;

ATOMIC CONCENTRATION; CHEMICAL COMPOSITION PROFILE; LINEAR CONCENTRATION GRADIENTS; STRANSKI-KRASTANOV MODES;

NANOSTRUCTURES;

EID: 34547248576 PISSN: 00036951 EISSN: None Source Type: Journal
DOI: 10.1063/1.2751598 Document Type: Article

Times cited : (13)

References (11)

1
- 0038473057
- Springer, New York
- V. Shchukin, N. Ledentsov, and D. Bimberg, Epitaxy of Nanostructures (Springer, New York, 2004).
- (2004) Epitaxy of Nanostructures
- Shchukin, V.¹ Ledentsov, N.² Bimberg, D.³

2
- 0000332808
- W. Dorsch, H. Strunk, H. Wawra, G. Wagner, J. Groenen, and R. Charles, Appl. Phys. Lett. 72, 179 (1998).
- (1998) Appl. Phys. Lett. , vol.72 , pp. 179
- Dorsch, W.¹ Strunk, H.² Wawra, H.³ Wagner, G.⁴ Groenen, J.⁵ Charles, R.⁶

3
- 0001647890
- S. Chaparro, Y. Zhang, and J. Drucker, Appl. Phys. Lett. 76, 3534 (2000).
- (2000) Appl. Phys. Lett. , vol.76 , pp. 3534
- Chaparro, S.¹ Zhang, Y.² Drucker, J.³

4
- 33750232003
- W. Neumann, H. Kirmse, I. Häusler, and R. Otto, J. Microsc. 223, 200 (2006).
- (2006) J. Microsc. , vol.223 , pp. 200
- Neumann, W.¹ Kirmse, H.² Häusler, I.³ Otto, R.⁴

5
- 2142659370
- E. Sutter, P. Sutter, and J. Bernard, Appl. Phys. Lett. 84, 2262 (2004).
- (2004) Appl. Phys. Lett. , vol.84 , pp. 2262
- Sutter, E.¹ Sutter, P.² Bernard, J.³

6
- 4344621536
- M. Skolnik and D. Mowbray, Annu. Rev. Mater. Res. 34, 181 (2004).
- (2004) Annu. Rev. Mater. Res. , vol.34 , pp. 181
- Skolnik, M.¹ Mowbray, D.²

7
- 17444426060
- M. Hanke, T. Boeck, A.-K. Gerlitzke, F. Syrowatka, F. Heyroth, and R. Köhler, Appl. Phys. Lett. 86, 142101 (2005).
- (2005) Appl. Phys. Lett. , vol.86 , pp. 142101
- Hanke, M.¹ Boeck, T.² Gerlitzke, A.-K.³ Syrowatka, F.⁴ Heyroth, F.⁵ Köhler, R.⁶

8
- 0034664609
- Z. Kovats, M. Rauscher, H. Metzger, J. Preisl, R. Paniago, H. Pfannes, J. Schulze, I. Eisele, F. Boscherini, and S. Ferrer, Phys. Rev. B 62, 8223 (2000).
- (2000) Phys. Rev. B , vol.62 , pp. 8223
- Kovats, Z.¹ Rauscher, M.² Metzger, H.³ Preisl, J.⁴ Paniago, R.⁵ Pfannes, H.⁶ Schulze, J.⁷ Eisele, I.⁸ Boscherini, F.⁹ Ferrer, S.¹⁰

9
- 0001437183
- A. Steinfort, P. Scholte, A. Ettema, F. Tuinstra, M. Nielsen, E. Landemark, D.-M. Smilgies, and R. Feidenhans'l, G. Falkenberg, and L. Seehofer, Phys. Rev. Lett. 77, 2009 (1996).
- (1996) Phys. Rev. Lett. , vol.77 , pp. 2009
- Steinfort, A.¹ Scholte, P.² Ettema, A.³ Tuinstra, F.⁴ Nielsen, M.⁵ Landemark, E.⁶ Smilgies, D.-M.⁷ Feidenhans'L, R.⁸ Falkenberg, G.⁹ Seehofer, L.¹⁰

10
- 0003397132
- BIOS
- R. Brydson, Electron Energy Loss Spectroscopy (BIOS, 2001), pp. 69-75.
- (2001) Electron Energy Loss Spectroscopy , pp. 69-75
- Brydson, R.¹

11
- 1642340347
- M. Hanke, M. Schmidbauer, D. Grigoriev, H. Raidt, P. Schäfer, R. Köhler, A.-K. Gerlitzke, and H. Wawra, Phys. Rev. B 69, 075317 (2004).
- (2004) Phys. Rev. B , vol.69 , pp. 075317
- Hanke, M.¹ Schmidbauer, M.² Grigoriev, D.³ Raidt, H.⁴ Schäfer, P.⁵ Köhler, R.⁶ Gerlitzke, A.-K.⁷ Wawra, H.⁸

* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.