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Volumn 103, Issue 10, 2008, Pages

Effects of interface states and temperature on the C-V behavior of metal/insulator/AlGaN/GaN heterostructure capacitors

Author keywords

[No Author keywords available]

Indexed keywords

CAPACITORS; ELECTRON EMISSION; THRESHOLD VOLTAGE; VOLTAGE CONTROL;

EID: 44649100738     PISSN: 00218979     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.2924334     Document Type: Article
Times cited : (176)

References (55)
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* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.