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Volumn 59, Issue 8, 1999, Pages 5561-5567

Origin of defect-related photoluminescence bands in doped and nominally undoped gan

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EID: 0001735480     PISSN: 10980121     EISSN: 1550235X     Source Type: Journal    
DOI: 10.1103/PhysRevB.59.5561     Document Type: Article
Times cited : (284)

References (31)
  • 13
    • 85038282810 scopus 로고    scopus 로고
    • The nature of the RT band-edge emission in n-type GaN is not well established. Donor bound exciton emission is unlikely since it is only observed at low temperatures. (Formula presented) and free exciton recombination, which nearly coincide in GaN:Si appear to be more likely than band-band transitions.
    • The nature of the RT band-edge emission in n-type GaN is not well established. Donor bound exciton emission is unlikely since it is only observed at low temperatures. (Formula presented) and free exciton recombination, which nearly coincide in GaN:Si appear to be more likely than band-band transitions.
  • 15
    • 85038277991 scopus 로고    scopus 로고
    • The shoulder 65 meV below (Formula presented) is its one LO phonon replica. Their peak separation is reduced by (Formula presented) from (Formula presented) as a consequence of momentum selection rules for the zero-phonon transition (Formula presented)
    • The shoulder 65 meV below (Formula presented) is its one LO phonon replica. Their peak separation is reduced by (Formula presented) from (Formula presented) as a consequence of momentum selection rules for the zero-phonon transition (Formula presented)
  • 24
    • 85038278902 scopus 로고    scopus 로고
    • Since the maximum peak shifts for the blue band exceed the LO phonon energy (91 meV) of GaN the proper value of ɛ in (Formula presented) in this case is that of the high-frequency dielectric constant.
    • Since the maximum peak shifts for the blue band exceed the LO phonon energy (91 meV) of GaN the proper value of ɛ in (Formula presented) in this case is that of the high-frequency dielectric constant.
  • 25
    • 77957062535 scopus 로고
    • Academic, New York R. K. Willardson A. C. Beer
    • H. B. Bebb and E. W. Williams, in Semiconductors and Semimetals, edited by R. K. Willardson and A. C. Beer (Academic, New York, 1970), Vol. 8, p. 181.
    • (1970) Semiconductors and Semimetals , vol.8 , pp. 181
    • Bebb, H.B.1    Williams, E.W.2
  • 30
    • 0000608072 scopus 로고
    • VCH, Weinheim W. Schröter E. J. Kramer P. Haasen R. W. Cahn
    • G. D. Watkins, in Materials Science and Technology Vol. 4, edited by R. W. Cahn, P. Haasen, E. J. Kramer, and W. Schröter (VCH, Weinheim, 1991), p. 105.
    • (1991) Materials Science and Technology Vol. 4 , pp. 105
    • Watkins, G.D.1
  • 31
    • 85038336058 scopus 로고    scopus 로고
    • H. Obloh, K.-H. Bachem, D. Behr, U. Kaufmann, A. Ramakrishnan, P. Schlotter, M. Seelmann-Eggebert, and J. Wagner, Advances in Solid State Physics, edited by B. Kramer (Vieweg, Braunschweig, in press).
    • H. Obloh, K.-H. Bachem, D. Behr, U. Kaufmann, A. Ramakrishnan, P. Schlotter, M. Seelmann-Eggebert, and J. Wagner, Advances in Solid State Physics, edited by B. Kramer (Vieweg, Braunschweig, in press).


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.