Determination of the polarization discontinuity at the AlGaN/GaN interface by electroreflectance spectroscopy

Applied Physics Letters

Volumn 86, Issue 18, 2005, Pages 1-3

  Winzer, A T ^a   Goldhahn, R ^a   Gobsch, G ^a   Link, A ^b   Eickhoff, M ^b   Rossow, U ^c   Hangleiter, A ^c  

^a ILMENAU UNIVERSITY OF TECHNOLOGY   (Germany)

^b WALTER SCHOTTKY INSTITUT   (Germany)

^c TECHNICAL UNIVERSITY OF BRAUNSCHWEIG   (Germany)

Author keywords

[No Author keywords available]

Indexed keywords

ELECTRIC POTENTIAL; GALLIUM NITRIDE; INTERFACES (MATERIALS); OSCILLATIONS; POLARIZATION; REFLECTION; SPECTROSCOPIC ANALYSIS;

ELECTROREFLECTANCE SPECTROSCOPY; HETEROINTERFACES; KELDYSH OSCILLATIONS; POLARIZATION DISCONTINUITY;

SEMICONDUCTING ALUMINUM COMPOUNDS;

EID: 20944435199     PISSN: 00036951     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.1923748     Document Type: Article

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