Reconstruction of three-dimensional chemistry and geometry using focused ion beam microscopy

Applied Physics Letters

Volumn 75, Issue 21, 1999, Pages 3414-3416

  Dunn, D N ^a   Hull, R ^a  

^a University of Virginia   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 0001480275     PISSN: 00036951     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.125311     Document Type: Article

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