Subsurface damage analysis by TEM and 3D FIB crack mapping in alumina and alumina/5vol.%SiC nanocomposites

Acta Materialia

Volumn 51, Issue 1, 2003, Pages 149-163

  Wu, Hou Zheng ^a   Roberts, S G ^a   Mobus G ^a   Inkson, B J ^a  

^a UNIVERSITY OF OXFORD   (United Kingdom)

Author keywords

Alumina; Dislocations; Focused ion beam (FIB); Microcracks; Nanocomposite; Subsurface damage; Transmission electron microscope (TEM)

Indexed keywords

ALUMINA; CERAMIC MATERIALS; DISLOCATIONS (CRYSTALS); FRACTURE; ION BEAMS; MICROCRACKS; PLASTIC DEFORMATION; POLYCRYSTALLINE MATERIALS; SILICON CARBIDE; TRANSMISSION ELECTRON MICROSCOPY;

SUBSURFACE DAMAGE;

NANOSTRUCTURED MATERIALS;

EID: 0037425476     PISSN: 13596454     EISSN: None     Source Type: Journal    
DOI: 10.1016/S1359-6454(02)00387-7     Document Type: Article

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