Tomographic spectral imaging with multivariate statistical analysis: Comprehensive 3D microanalysis

Microscopy and Microanalysis

Volumn 12, Issue 1, 2006, Pages 36-48

  Kotula, Paul G ^a   Keenan, Michael R ^a   Michael, Joseph R ^a  

^a SANDIA NATIONAL LABORATORIES   (United States)

Author keywords

3D chemical analysis; 3D microanalysis; Multivariate curve resolution; Multivariate statistical analysis; Serial sectioning; Spectral imaging; Tomographic spectral imaging; Tomography

Indexed keywords

METAL;

ARTICLE; CHEMICAL STRUCTURE; COMPUTER ASSISTED TOMOGRAPHY; ELECTRON PROBE MICROANALYSIS; MULTIVARIATE ANALYSIS; SENSITIVITY AND SPECIFICITY;

ELECTRON PROBE MICROANALYSIS; METALS; MODELS, MOLECULAR; MULTIVARIATE ANALYSIS; SENSITIVITY AND SPECIFICITY; TOMOGRAPHY, X-RAY COMPUTED;

EID: 33644871993     PISSN: 14319276     EISSN: 14358115     Source Type: Journal    
DOI: 10.1017/S1431927606060193     Document Type: Article

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