Unlimited tilt for ultra-narrow lenses: Tomography at highest resolution?

Microscopy and Microanalysis

Volumn 10, Issue SUPPL. 2, 2004, Pages 1196-1197

  Mobus G ^a   Inkson, B J ^a   Ross, I M ^a   Morrison, R ^b  

^a UNIVERSITY OF SHEFFIELD   (United Kingdom)

^b GATAN INC   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 4544314534     PISSN: 14319276     EISSN: None     Source Type: Journal    
DOI: 10.1017/S1431927604883351     Document Type: Conference Paper

References (7)

1. A.J. Koster et al., J phys chem., B 104, (2000) 9368.
2. M. Koguchi et al., J. Electron Microsc. 50 (2001) 235.
3. G. Möbus, B.J. Inkson, Appl. Phys. Lett., 79 (2001) 1369, and Ultramicr. 96 (2003) 433-451.
4. G. Möbus, B.J. Inkson, Appl. Phys. Lett., 79 (2001) 1369, and Ultramicr. 96 (2003) 433-451.
5. P. Midgley et al., Chem. Communic. 10 (2001) 907-908, and Ultramicr. 96 (2003) 413-431.
6. P. Midgley et al., Chem. Communic. 10 (2001) 907-908, and Ultramicr. 96 (2003) 413-431.
7. We kindly acknowledge R. Short for providing the sample of Fig 3.